76 results about "Texture measure" patented technology

Methods are described of evaluating the genuineness of a sample presented for biometric evaluation. The sample is illuminated under distinct optical conditions. Light scattered from the sample is received. Multiple images are formed, each image being formed from the received light for one of the optical conditions. A set of texture measures is generated, each texture measure being generated from one of the images. It is determined whether the generated texture measures is consistent with the sample being authentic unconcealed biological tissue.

A surface texture measuring machine includes: a stage, a contact-type detector (20) having a stylus, an image probe (30), a relative movement mechanism (40) and a controller (50). The controller (50) includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.

A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.

A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the laser beam to be irradiated on the near-field probe (33), a detection element (38) that detects scattering effect of the near-field light generated when the near-field probe (33) is moved close to a workpiece (1), and an actuator (32) that displaces the near-field probe (33) and the workpiece (1) in a direction moving close to / away from each other, includes: a laser length-measuring unit (20) that measures a relative distance between a reference position and the workpiece (1) in the vicinity of the tip end of the near-field probe (33) or a relative distance between the reference position and the near-field probe (33).

A contour and surface texture measuring instrument for measuring a contour and surface texture of a surface of a work, which generates a displacement signal having a high resolution and high linearity in a wide measurement range is disclosed, the contour and surface texture measuring instrument having a measurement part having a stylus configured to come into contact with the surface of the work and to change its position vertically, a feed mechanism configured to move the work with respect to the stylus, an arm having the measurement part at one end and configured to transfer a displacement of the stylus to rotate with a pivot, and a differential transformer-type measuring mechanism and a scale-type measuring mechanism attached to the arm or to a position interlocked with the arm and configured to detect a displacement of the stylus.

A surface texture measuring apparatus includes a stylus displacement detector having a measurement arm which is able to swing, a pair of styli provided at a tip of the measurement arm, and a detection unit configured to detect swing amounts of the measurement arm, a stage configured to mount the subject of measurement thereon, and a relative movement mechanism configured to cause a relative movement between the detector and the stage. The apparatus includes a posture switching mechanism configured to switch a posture of the measurement arm between a posture in which the measurement arm is urged in one swing direction and a posture in which the measurement arm is urged in the other swing direction, and a speed control mechanism configured to control a switching speed of posture switching of the measurement arm to a preset speed when the posture of the measurement arm is switched by the posture switching mechanism.

A surface texture measuring instrument includes: a movement-estimating unit for estimating a movement condition of a drive mechanism based on a scanning vector command issued by a scanning vector commander to calculate an estimated operation state quantity; and a correction-calculating unit for correcting a detection value of a drive sensor in accordance with the estimated operation state quantity calculated by the movement-estimating unit. The movement-estimating unit includes: a nominal-model setting unit in which a nominal model representing signal transfer function of the scanning vector command from the issuance of the scanning vector command to a reflection on a movement position of the scanning probe is stored. The correction-calculating unit includes a correction-amount calculating unit that calculates a correction amount for correcting a measurement error generated on account of deformation during the drive of the drive mechanism based on the estimated operation state quantity; and a measurement data synthesizing unit that synthesizes the detection value of the drive sensor and a detection sensor and the correction amount calculated by the correction-amount calculating unit to acquire a measurement data.

A texture measuring apparatus that measures surface information of an object includes: a probe coming into contact with the object while moving on a surface of the object; a first sensor unit, provided at the probe, for detecting a force acting on the probe in a direction perpendicular to a lengthwise direction of the probe; and a second sensor unit, provided at the rear of the probe, for detecting a force acting on the probe in the lengthwise direction of the probe. The apparatus further includes a third sensor unit, provided between the first sensor unit and the second sensor unit, for detecting variations in the forces acting on the probe.