The invention relates to the technical field of analog integrated circuits, in particular to an anti-transient-electric-stress low-
delay demodulation circuit and
system, and the circuit employs two comparators to compare the positive input and negative input of an original modulation
signal with a bias
voltage, so that when the original modulation
signal is not input, the output original
signal maintains a normal low level unchanged; when an original modulation signal is input, no matter whether a positive common-mode transient
electric stress event or a negative common-mode transient
electric stress event occurs, the levels of the external input ends of the two
comparator modules are pulled up or pulled down at the same time, the first level signal and the second level signal can respond to the abnormal event to be overturned to the same level, so that the first level signal and the second level signal are converted to the same level. And original signal output is forcibly set to zero, so that error information generated by a common-mode transient
electric stress event is shielded and isolated, and the influence on the accuracy of signal
demodulation is reduced. And finally, an
error signal caused by a common-mode transient electric stress event when the modulation signal is demodulated is identified and corrected, and the accuracy and the reliability of signal
demodulation are improved.