Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test
system. In one embodiment, a test
system configuration adapter includes a tester side socket, a break out pin, and a
device under test side slot. The tester side socket is configured to couple with a
test equipment socket. The break out pin is configured to couple with the supplemental equipment. The
device under test side slot is configured to couple with the tester side socket, the break out pin, and a
device under test, wherein the tester side socket. The test
system configuration adapter is configured to enable communication between
test equipment coupled to the
test equipment socket and supplemental equipment coupled to the breakout pin while the device under test remains coupled to the device under test side slot. In one exemplary implementation, the breakout pin and tester side socket are selectively coupled to the device under test side slot. The test
system configuration adapter can include a switch configured to switch a portion of the
coupling of the device under test side slot to the tester side socket and the break out pin.