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7results about "Miniaturised spectrometers" patented technology

Ion trap chip and system

ActiveEP4064136B1Quantum computersMiniaturised spectrometers
An ion trap chip and a system are disclosed, and are applicable to the field of quantum computing. The ion trap chip includes: a plurality of first ion traps (10), each configured to store an operation ion, where two adjacent first ion traps (10) form one ion trap group (30); and a plurality of second ion traps (20), where the second ion trap (20) corresponds to one ion trap group (30), and the second ion trap (20) is configured to perform quantum operations of operation ions (101) stored in the corresponding ion trap group (30). The second ion trap (20) is located between two first ion traps (10) in the corresponding ion trap group (30). The operation ions (101) stored in the first ion traps (10) in the ion trap group (30) are transported to the corresponding second ion trap (20) along a straight line. In the ion trap chip, an ion storage area and a quantum operation area are separated, and the ion storage area and the corresponding quantum operation area are located in a same straight line, so that ion transport does not require a turning. This greatly improves quantum computing efficiency.
Owner:HUAWEI TECH CO LTD

Mass spectrometer

PendingEP4718497A1Miniaturised spectrometersTube vacuum systems
Provided is a mass spectrometer capable of ensuring a work space for maintenance or the like of a turbomolecular pump as compared with one in the related art. A mass spectrometer 10, 10A, 10B includes: an ion source 30; a vacuum chamber 40 into which a sample ion ionized by the ion source 30 is introduced; and a turbomolecular pump 50, 50A, 50B configured to maintain the vacuum chamber 40 in a vacuum. The turbomolecular pump 50, 50A, 50B is provided above the vacuum chamber 40 in a vertical direction.
Owner:HITACHI HIGH TECH CORP

Mass spectrometry to identify predictive failure with chemical detection in microelectronic systems

The invention generally relates to systems and methods for analyzing operational status of an electronic instrument. In certain embodiments, the invention provides systems that include a sampling module that operable couples to an electronic instrument in a manner that the sampling module receives a vapor emitted from the electronic instrument, the sampling module comprising an ionization source and one or more mass analyzers to thereby produce a chemical signature of one or more analytes in the vapor; and an analysis module operable coupled to the sampling module to receive the chemical signature of the one or more analytes in the vapor and compare the received chemical signature to a database of known chemical signatures to thereby determine operational status of the electronic instrument.
Owner:PURDUE RES FOUND

Quadrupole mass filters and related systems and methods

PendingUS20260106362A1Additive manufacturing apparatusMiniaturised spectrometers
What is disclosed herein are quadrupole mass filters (QMF) and related methods. The QMFs may have a relatively high surface roughness and / or be additively manufactured, wherein the QMF may be configured for ion filtering in a mass spectrometer. The methods may comprise: a. applying transverse sections to produce a dielectric part; b. masking one or more surfaces of the dielectric part to produce a partially masked dielectric part; c. positioning a metal on the partially masked dielectric part with a metal conductor to produce one or more electrically conductive surfaces on the printed part; and d. removing the mask from the printed part to produce a finished QMF; wherein the QMF is configured for ion filtering in a mass spectrometer.
Owner:MASSACHUSETTS INST OF TECH +1

Sample quantitation using miniature mass spectrometer

The invention generally relates to sample analysis with a miniature mass spectrometer. In certain embodiments, the invention provides methods that involve generating ions of a first analyte and ions of a second analyte. Those ions are transferred through a discontinuous sample introduction interface into a first ion trap of a mass spectrometer in a manner in which the discontinuous sample introduction interface remains open during the transferring. The discontinuous sample introduction interface is closed and the ions are sequentially transferred to a second ion trap of the mass spectrometer where they are sequentially analyzed.
Owner:PURDUE RES FOUND

Ion trap chip and system

ActiveUS12537181B2Quantum computersMiniaturised spectrometersIon trap mass spectrometryParticle physics
Example ion trap chips and quantum computing methods are described. One example ion trap chip includes a plurality of first ion traps and a plurality of second ion traps. Each first ion trap is configured to store an operation ion, where two adjacent first ion traps form one ion trap group. Each second ion trap corresponds to one ion trap group. Each second ion trap is configured to perform quantum operations of operation ions stored in a corresponding ion trap group, and each second ion trap is located between two first ion traps in a corresponding ion trap group. Operation ions stored in first ion traps in an ion trap group are transported to a corresponding second ion trap along a straight line.
Owner:HUAWEI TECH CO LTD

Mass spectrometer and calibration method for mass spectrometer

Provided are a mass spectrometer and a calibration method for a mass spectrometer capable of performing calibration more easily than one in the related art. A mass spectrometer 100 according to the present embodiment described above includes: an ion source 101 configured to ionize a sample; a detection unit 105 including a photomultiplier tube 105a and configured to analyze a mass of the sample ionized by the ion source 101; a vacuum chamber 102 configured to allow the ion source 101 to communicate with the detection unit 105; a vacuum gauge 106 configured to measure a vacuum degree inside the vacuum chamber 102; and a data analysis unit 112 and an analysis control unit 113 configured to calibrate setting of the photomultiplier tube 105a using electrons emitted from the vacuum gauge 106.
Owner:HITACHI HIGH TECH CORP