The invention discloses an automatic batch test device for chip capacitors and a use method, the device comprises a console, the middle part of the console surface is longitudinally provided with a slide rail I, a slide rail II is transversely arranged above the slide rail I, the slide rail I is in sliding connection with a tray for placing a capacitor test board, and the slide rail II is in sliding connection with a slide block. A third sliding rail is arranged on the outer side of the sliding block and slidably connected with a testing end, the testing end is connected with a testing instrument through a wire, and the testing instrument is electrically connected with a computer. The tray, the sliding block and the test end are respectively driven by a motor to move longitudinally, transversely and vertically, and the motor is connected with a computer. During use, a stacking declaration is set through a computer, an arch-shaped triggering position is formulated, a test contact is operated to reach a stacking starting point and sends an in-place signal, test is started, and the test is completed by running a stacking point according to stacking setting. According to the invention, the detection efficiency of the small-size chip capacitor is improved, and automatic and batch testing of the chip capacitor is realized.