55 results about "Partial scan" patented technology

This invention relates to a method and apparatus for combined stuck-fault testing and partial scan delay-fault built-in self testing (BIST). For partial scan delay-fault BIST, the circuit is modeled for breaking all flip-flop feedback cycles in the circuit. A selection of flip-flops to be scanned to break all sequential cycles is determined from an optimal feedback vertex set. A digest, devour and tidy-up (DDT) heuristic can be used on a weighted signed graph formed from an S-graph of the circuit to determine an optimal feedback vertex set. Determined partial scan delay fault BIST hazards can be removed from the circuit by inserting parity flippers to invert selected paths during testing. The same DDT heuristic can be used to determine optimal placement of the parity flippers in the circuit.

The present invention is directed to a method and system of controlling rotation of a gantry to rotate at a rotational speed such that a desired relationship between center projection angles of neighboring partial scans is maintained.

The stripping agent is sprayed from the tip of the nozzle 33 onto the wafer surface, while the first supply nozzle 33 is actuated to scan from the central portion of the wafer to the outer portion thereof. This operation provides the situation, in which the interface of the residual droplet 38 is pulled back from the center of the wafer to the outer portion of the wafer by the surface tension of the stripping agent supplied from the nozzle. Meanwhile, the second supply nozzle 36 also scans at a same scanning speed as the first supply nozzle 33 scans. Vapor IPA is sprayed from the orifice of the second supply nozzle 36. This provides that vapor IPA is sprayed onto the wafer surface immediately after the stripping agent is sprayed thereon from the first supply nozzle 33, and the residual stripping agent on the wafer surface is efficiently replaced with IPA.

A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

The present invention is directed to a method and system of blending data acquired from neighboring partial-scans. Data is acquired from an imaging volume in a series of fractional or partial-scans. Each partial-scan samples a fraction of the imaging volume. During reconstruction, data from the partial-scans are combined to compensate for the unsampled portion of the imaging volume that is experienced in any partial-scan alone.

The invention provides 'displays with multiple scanning modes'. An electronic device may include a display such as a light-emitting diode display. The electronic device may be a head-mounted device that provides a virtual reality or augmented reality environment to a user. To reduce artifacts in the display, a display may be operable in both a normal scanning mode and a partial scanning mode. In the normal scanning mode, every row of the display may be enabled to emit light in each frame. In the partial scanning mode, only a subset of the rows of the display may be enabled to emit light in each frame. The display may have a higher refresh rate in the partial scanning mode than in the normal scanning mode. A grid driver circuit can comprise a shift register with multiple register circuits.At least one register circuit can have first input and second input different from the first input.

The present invention is directed to a method and system of controlling rotation of a gantry to rotate at a rotational speed such that a desired relationship between center projection angles of neighboring partial scans is maintained.

A system and method is provided for reducing partial scan reconstruction artifacts in sinogram data acquired as a series of sets of partial-scan projection views, each set of projection views extending over an angular range of less than 360 degrees. A full-scan sinogram matrix for each of the sets of projection views in the series is created and each set of partial-scan projection views is stored in a respective full-scan sinogram matrix to create an array of full-scan matrices having respective empty spaces not filled by partial-scan projection view data stored therein. The empty spaces are filled in each of the full-scan sinogram matrices using the partial-scan projection view data stored therein and an image of the subject is reconstructed from the full-scan sinogram matrices having the empty spaces filled using the partial-scan projection view data stored therein.

The invention relates to a partial-scan-based CT image reconstruction method, apparatus and CT device. The method comprises the following steps: CT scanning is started when a scanning angle is [beta]start, the CT scanning ends when the scanning angle is [beta]end, original data of the scanning angle which ranges from [beta]start to [beta]end can be obtained, first projection data can be obtained by weighing the original data, second projection data of the scanning angle which ranges from [beta]start-z to [beta]end+z are obtained according to extension of the first projection data, rearrangement data are obtained by rearranging the second projection data, and a CT reconstruction image is obtained by subjecting the rearrangement data to image reconstruction operation. According to the partial-scan-based CT image reconstruction method, apparatus and CT device, parallel processing of the projection data can be realized, and waiting time of a system can be reduced.

Embodiments of the present invention can be configured to recognize and / or track certain types of touch input detected by a touch sensor, such as stylus input, during the performance of standard “full” touch scans in which each drive line of the touch sensor is generally scanned. Upon detection of these input types, “partial” touch scan operations can advantageously be performed which can dynamically reduce the number of lines scanned in a power-saving manner. These partial scans can be configured to intelligently initially scan the area where these input types were last detected so that there is minimal need to return to a previous “full” scan mode. If these specified touch inputs types are not detected during a “partial” scan mode, the touch sensor can be restored to a “full” scan mode until a subsequent detection of the touch input is determined, in which the touch sensor can be returned to a “partial” scan mode. Each time a partial scan is used, power is saved.

A method for conducting a perfusion study includes performing an initial full scan of an area of interest in an object, and performing at least one subsequent partial scan of the area of interest to detect motion of a contrast agent.

The invention provides a signal stability detector and a time delay tester employing the signal stability detector. Each key combination logic output point of the time delay tester is provided with one corresponding signal stability detector for detecting whether a signal output by each key combination logic output point in the stable period of a combination logic signal rolls over or not; and moreover, the time delay tester is also provided with a global error signal generator for generating a global error signal when any signal stability detector detects that the combination logic signal rolls over in a detection scope so as to indicate the timing out of a circuit. The time delay tester not only can be used for effectively implementing online time delay failure detection, but also applies a partial scan enable signal generator in a scan chain of the circuit. The time delay tester can be used for effectively conducting online time delay failure detection, and can be used for providing effective support for off-line time delay failure detection. Moreover, hardware expenses are lower.

A method and a system for obtaining an object three-dimensional model are disclosed. The invention is applicable to the technical field of three-dimensional visualization and provides a method for generating a three-dimensional object model. The method comprises a step of obtaining the information of the color image and collected by a camera, a step of removing a plane and downsampling, a step of selecting a random sample point and a computer descriptor, a step of carrying out model preprocessing, calculating a model descriptor and filling the descriptor into a hash table, a step of determining a matching area of inputting 3D data and a 3D object model, a step of using the 3D model data to fill the missed and fuzzy points in the matching area, a step of using the 3D model data to extrapolate an area which can not be observed, and a step of obtaining a complete 3D model with high precision. According to the method and the system, the object three-dimensional model can be rapidly and automatically established, a known data structure is directly obtained, the subsequent analysis and measurement are facilitated, even a noise or partial scan information exists, a fully formed 3D model can be outputted always, and the method and the system are suitable for a moving object.

A method for conducting a perfusion study includes performing an initial full scan of an area of interest in an object, and performing at least one subsequent partial scan of the area of interest to detect motion of a contrast agent.

Disclosure is related to a method for sensing fast motion, a controller, and a related electromagnetic sensing apparatus. The method is applicable to a touch panel, in which a fast scan mode is introduced when a fast motion made by an electromagnetic stylus is sensed under a partial scan mode. Therefore, the scan mode is switched to the fast scan mode which is used to acquire coordinates of the stylus according to the electromagnetic signals generated by the stylus. After that, the process goes back to the partial scan mode for continuously sensing the location of the electromagnetic stylus, and determining any fast motion behavior. In one embodiment, in order to obtain the coordinates of the stylus when its moving rate exceeds a threshold, a moving direction may be firstly determined. The one or more sensing loops may be opened in the direction of movement.

A flat panel display comprises a substrate, a plurality of data lines, a plurality of scan lines, a source electrode driver element and a grid electrode driver element. The substrate comprises a pixel array. The plurality of data lines are electrically connected to the pixel array. The plurality of scan lines comprise p groups of scan lines and are electrically connected with the pixel array, and P is a positive integer. In the same group of the scan lines, at least partial scan lines are not adjacent. The source electrode unit is electrically connected to the partial scan lines. The grid electrode driver element comprises p shift register circuits which are respectively used to enable the p groups of scan lines. In a first picture frame period, the p groups of scan lines are enabled by a first group sequence; in a second picture frame period, the p groups of scan lines are enabled by a second group sequence, and the first group sequence is different from the second group sequence.

Exemplary method, computer-accessible medium, test architecture, and system can be provided for a partial-scan test of at least one integrated circuit. For example, it is possible to obtain a plurality of test cubes using a first combinational automatic test pattern generation (ATPG) and identify at least one flip-flop of the integrated circuit using the test cubes to convert to a non-scan flip-flop and facilitate the partial-scan test to utilize the cubes without a utilization of a sequential ATPG or a second combinational ATPG.

A method for performing an exact volume imaging with a C-arm digital x-ray imaging system by moving the source through two partial circular scans which form a complete source trajectory. The partial circular scans form a complete source trajectory when the plane defined by the C-arm is repositioned for the second scan at an angle equal to the cone angle with respect to the long axis of the patient.

A scanning method for determining the touch position of a touch input apparatus is disclosed. First of all, a first exposure process on light sensors of the touch input apparatus by light emitting device of the touch input apparatus is performed. Then the light sensors are scanned. A light sensor generating a signal with a maximum value is located. A region of partial scan of the light sensors is determined according to the position of the light sensor generating the signal with the maximum value. A second exposure process is performed on the light sensors. Then the light sensors within the region of partial scan are scanned. A light sensor generating a signal with a maximum value within the region of partial scan is located and a next region of partial scan is determined. The maximum value of the signal is calculated and the maximum value of the signal is compared to a predetermined value to determine whether the maximum value is higher than the predetermined value.

In an ultrasound diagnostic apparatus for forming a Doppler image, a plurality of partial regions are set within a scan region in which Doppler information is obtained. A partial scan operation is performed a plurality of times in a repetitive manner in each of the partial regions. In each partial region, a set of dummy transmitting and receiving beams is formed immediately before formation of the first set of transmitting and receiving beams. As the receiving beam in the first set of the transmitting and receiving beams is affected by the dummy transmitting beam, the receiving conditions can be unified over a plurality of sets of transmitting and receiving beams. A set of dummy transmitting and receiving beams may be provided immediately before the first partial scan operation or formation of a set of dummy transmitting and receiving beams in such a case may be omitted.

A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

A scanning method for determining the touch position of a touch input apparatus is disclosed. First of all, a first exposure process on light sensors of the touch input apparatus by light emitting device of the touch input apparatus is performed. Then the light sensors are scanned. A light sensor generating a signal with a maximum value is located. A region of partial scan of the light sensors is determined according to the position of the light sensor generating the signal with the maximum value. A second exposure process is performed on the light sensors. Then the light sensors within the region of partial scan are scanned. A light sensor generating a signal with a maximum value within the region of partial scan is located and a next region of partial scan is determined. The maximum value of the signal is calculated and the maximum value of the signal is compared to a predetermined value to determine whether the maximum value is higher than the predetermined value.

A design supporting apparatus is disclosed, including: an inputting part; a syntactic analyzing part; and a scanning and searching part. The inputting part inputs functional description data of a register transfer level. The syntactic analyzing part conducts a syntactic analysis for the functional description data and develops a parse tree. The scanning and searching part scans and searches for the parse tree being developed by the syntactic analyzing part and searches for a description representing a comparison operator having multiple bits, the comparison operator being difficult to detect a fault by test data formed by pseudo-random numbers, which are applied from a pseudo-random number generator of a logic built-in self-test.

A virtual training system includes a 3D scanner in recording space and a camera. A scan of the recording space are received and combined to make a sequence of models of the recording space while a tasks is being performed. The model states are presented in sequence to a trainee in a playback space and the actions of the trainee are detected. Deviation of the trainee or objects in the playback space from the trainer and objects in the recording space may be detected and alerts generated. Scanning of the recording space may be accelerated by making a full scan followed by partial scans. The partial scans may be performed in response to detected movement.

The invention provides a touch display device and a touch and display scanning method thereof. The touch and display scanning method includes: distinguishing the frame time period from the first sub-period and the second sub-period; performing a display scanning action on the plurality of display scan lines in the plurality of display scan lines in the first sub-period, and Performing a touch detection operation on the touch display device; performing a display scan operation on the plurality of second partial scan lines in the display scan line in the second sub-period, and performing a touchdetection operation on the touch display device .

Embodiments of the present invention can be configured to recognize and / or track certain types of touch input detected by a touch sensor, such as stylus input, during the performance of standard “full” touch scans in which each drive line of the touch sensor is generally scanned. Upon detection of these input types, “partial” touch scan operations can advantageously be performed which can dynamically reduce the number of lines scanned in a power-saving manner. These partial scans can be configured to intelligently initially scan the area where these input types were last detected so that there is minimal need to return to a previous “full” scan mode. If these specified touch inputs types are not detected during a “partial” scan mode, the touch sensor can be restored to a “full” scan mode until a subsequent detection of the touch input is determined, in which the touch sensor can be returned to a “partial” scan mode. Each time a partial scan is used, power is saved.

A scanning display includes a plurality of light sources, and a scanner for scanning lights from the plurality of light sources in two-dimensional directions, wherein the scanner scans the lights from different light sources in two or more partial scanning areas arranged in a first direction in a range corresponding to a whole scanning area, and scans, for each partial scanning area, the light at a first speed in the first direction and at a second speed higher than the first speed in a second direction different from the first direction, and wherein the scanner has the scan frequency of 10 kHz or greater in the second direction.

A system and method is provided for reducing partial scan reconstruction artifacts in sinogram data acquired as a series of sets of partial-scan projection views, each set of projection views extending over an angular range of less than 360 degrees. A full-scan sinogram matrix for each of the sets of projection views in the series is created and each set of partial-scan projection views is stored in a respective full-scan sinogram matrix to create an array of full-scan matrices having respective empty spaces not filled by partial-scan projection view data stored therein. The empty spaces are filled in each of the full-scan sinogram matrices using the partial-scan projection view data stored therein and an image of the subject is reconstructed from the full-scan sinogram matrices having the empty spaces filled using the partial-scan projection view data stored therein.

A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).