The application relates to a light-emitting
diode test circuit, a driving
chip, a display module and a display panel. The light-emitting
diode test circuit comprises: a plurality of first conductive elements, each first conductive element being used for corresponding connection with an
anode of each light-emitting
diode on a display module to be tested; a plurality of second conductive elements, each second conductive element being used for corresponding connection with a
cathode of each light-emitting diode on the display module to be tested; a first conductive
test element, which is connected with each first conductive element and is used for receiving a first driving
voltage provided by an external test device; and a second conductive
test element, which is connected with each second conductive element and is used for receiving a second driving
voltage provided by the external test device, wherein the first driving
voltage is greater than the second driving voltage. By using the above light-emitting diode test circuit, the number of top pins of a detection device can be reduced, and thus the detection cost is reduced.