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59results about How to "Easily correlated" patented technology

Correlating captured images and timed 3D event data

A method for correlating tracking data associated with an activity occurring in a three-dimensional space with images captured within the space comprises the steps of: (a) locating a camera with respect to the three-dimensional space, wherein the camera at a given location has a determinable orientation and field of view that encompasses at least a portion of the space; (b) capturing a plurality of images with the camera and storing data corresponding to the images, including a capture time for each image; (c) capturing tracking data from identification tags attached to the people and/or objects within the space and storing the tracking data, including a tag capture time for each time that a tag is remotely accessed; (d) correlating each image and the tracking data by interrelating tracking data having a tag capture time in substantial correspondence with the capture time of each image, thereby generating track data corresponding to each image; (e) utilizing the track data to determine positions of the people and/or objects within the three dimensional space at the capture time of each image; and (f) utilizing the location and orientation of the camera to determine the portion of the space captured in each image and thereby reduce the track data to a track data subset corresponding to people and/or objects positioned within the portion of space captured in each image.
Owner:KODAK ALARIS INC

Correlating captured images and timed 3D event data

A method for correlating tracking data associated with an activity occurring in a three-dimensional space with images captured within the space comprises the steps of: (a) locating a camera with respect to the three-dimensional space, wherein the camera at a given location has a determinable orientation and field of view that encompasses at least a portion of the space; (b) capturing a plurality of images with the camera and storing data corresponding to the images, including a capture time for each image; (c) capturing tracking data from identification tags attached to the people and / or objects within the space and storing the tracking data, including a tag capture time for each time that a tag is remotely accessed; (d) correlating each image and the tracking data by interrelating tracking data having a tag capture time in substantial correspondence with the capture time of each image, thereby generating track data corresponding to each image; (e) utilizing the track data to determine positions of the people and / or objects within the three dimensional space at the capture time of each image; and (f) utilizing the location and orientation of the camera to determine the portion of the space captured in each image and thereby reduce the track data to a track data subset corresponding to people and / or objects positioned within the portion of space captured in each image.
Owner:KODAK ALARIS INC

Three-dimensional image display apparatus and method

A three-dimensional image display apparatus is provided that can integrate and visualize 3D measurement data obtained from a stereo image with an image of a measuring object to which stereoscopic texture is applied. The apparatus includes: an orientation section 24 for finding relationship as to corresponding points in a stereo image of a measuring object 1 based on the position and the tilt at which the stereo image was photographed; a three-dimensional coordinate data section 31 for obtaining three-dimensional coordinate data on the corresponding points of the measuring object 1 based on the relationship as to the corresponding points found by the orientation section 24; a model forming section 32 for forming a model of the measuring object 1 based on the three-dimensional coordinate data on the corresponding points; an image correlating section 34 for correlating the stereo image of the measuring object stored in the stereo image data storage section 12 and the model formed by the model forming section 32, using the relationship as to the corresponding points found by the orientation section 24; and a model display section 35 for displaying an image of the measuring object 1 to which stereoscopic texture is applied, using the stereo image correlated with the model by the image correlating section 34.
Owner:KK TOPCON

Designing scan chains with specific parameter sensitivities to identify process defects

A method is disclosed for designing scan chains in an integrated circuit chip with specific parameter sensitivities to identify fabrication process defects causing test fails and chip yield loss. The composition of scan paths in the integrated circuit chip is biased to allow them to also function as on-product process monitors. The method adds grouping constraints that bias scan chains to have common latch cell usage where possible, and also biases cell routing to constrain scan chain routing to given restricted metal layers for interconnects. The method assembles a list of latch design parameters which are sensitive to process variation or integrity, and formulates a plan for scan chain design which determines the number and the length of scan chains. A model is formulated of scan chain design based upon current state of yield and process integrity, wherein certain latch designs having dominant sensitivities are chosen for specific ones of the scan chains on the chip. The model is provided as input parameters to a global placement and wiring program used to lay out the scan chains. Test data on the chip is then analyzed to determine and isolate systematic yield problems denoted by attributes of a statistically significant failing population of a specific type of scan chain.
Owner:IBM CORP

Designing Scan Chains With Specific Parameter Sensitivities to Identify Process Defects

A method is disclosed for designing scan chains in an integrated circuit chip with specific parameter sensitivities to identify fabrication process defects causing test fails and chip yield loss. The composition of scan paths in the integrated circuit chip is biased to allow them to also function as on-product process monitors. The method adds grouping constraints that bias scan chains to have common latch cell usage where possible, and also biases cell routing to constrain scan chain routing to given restricted metal layers for interconnects. The method assembles a list of latch design parameters which are sensitive to process variation or integrity, and formulates a plan for scan chain design which determines the number and the length of scan chains. A model is formulated of scan chain design based upon current state of yield and process integrity, wherein certain latch designs having dominant sensitivities are chosen for specific ones of the scan chains on the chip. The model is provided as input parameters to a global placement and wiring program used to lay out the scan chains. Test data on the chip is then analyzed to determine and isolate systematic yield problems denoted by attributes of a statistically significant failing population of a specific type of scan chain.
Owner:IBM CORP
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