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34 results about "Spin–orbit interaction" patented technology

In quantum physics, the spin–orbit interaction (also called spin–orbit effect or spin–orbit coupling) is a relativistic interaction of a particle's spin with its motion inside a potential. A key example of this phenomenon is the spin–orbit interaction leading to shifts in an electron's atomic energy levels, due to electromagnetic interaction between the electron's magnetic dipole, its orbital motion, and the electrostatic field of the positively charged nucleus. This phenomenon is detectable as a splitting of spectral lines, which can be thought of as a Zeeman effect product of two relativistic effects: the apparent magnetic field seen from the electron perspective and the magnetic moment of the electron associated with its intrinsic spin. A similar effect, due to the relationship between angular momentum and the strong nuclear force, occurs for protons and neutrons moving inside the nucleus, leading to a shift in their energy levels in the nucleus shell model. In the field of spintronics, spin–orbit effects for electrons in semiconductors and other materials are explored for technological applications. The spin–orbit interaction is one cause of magnetocrystalline anisotropy and the spin Hall effect.

Nano-light field spin-orbit interaction measurement system and method

ActiveCN109596576AAchieving handedness resolutionAchieving spin-orbit interactionsAnalysis by material excitationBeam splittingOptoelectronics
The invention discloses a spin-resolved probe heterodyne interference device, a nano-light field spin-orbit interaction measurement system and method. The probe heterodyne interference device comprises the following parts: a beam splitting module, through which the single beam laser is divided into an original measuring light and an original reference light; a difference frequency generating device, configured to perform frequency modulation on the original measuring light and the original reference light, and output a measuring light and a reference light with predetermined frequency difference; a measuring light polarization control device, disposed in the transmission direction of the measuring light; a focusing scanning device, arranged to output the illumination light in the output direction of the reference light of the measuring light polarization control device; an aperture type scanning near-field optical microscope device, wherein the illumination light excites samples to generate nano light fields, and the aperture type scanning near-field optical microscope device collects the nano-light fields in near-field detection and outputs sample information light; a reference light polarization compensation device, disposed in the transmission direction of reference light, wherein the reference light is incident on the reference light polarization compensation device to output polarization compensation light; and a coupling device, to which the sample information light and the polarization compensation light are transmitted to interfere to generate heterodyne interference light.
Owner:TSINGHUA UNIV
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