85results about "Weighing apparatus using radiation" patented technology

An x-ray inspection apparatus includes a sample image obtaining unit, an ideal curve generating unit, a curve adjustment unit, and a mass estimation unit as a function block generated by a control computer. The sample image obtaining unit obtains 10 x-ray transmission images of sample inspected products each of whose mass is known in advance. The ideal curve generating unit generates a table based on a formula that indicates a relationship between the brightness of an area included in the x-ray transmission images and the estimated mass of the area. The curve adjustment unit refers to the input actual mass of each x-ray transmission image and adjusts the table such that the estimated mass approximates the actual mass. The mass estimation unit determines the estimated mass per unit area based on the post-adjusted table and adds up these masses to determine the total estimated mass of the product.

The invention relates to a process for the non-destructive net weighing of capsules using microwaves.

A machine for dosing a plurality of products in capsules (200), or similar containers, comprises a plurality of dosing units (3, 4, 5) for filling the capsules (200) with respective products and turret means (2) that rotates intermittently and is arranged for housing and moving the capsules (200) in sequence through the dosing units (3, 4, 5); the machine further comprises a plurality of checking units (6, 7, 8) each of which is located downstream of a respective dosing unit (3, 4, 5) for measuring a quantity of product dosed in the capsules (200) by said respective dosing units (3, 4, 5).

The invention provides a method, system and equipment for acquiring pole piece quality information, and relates to the technical field of batteries. The method includes the following steps that slitting parameters and scanning parameters of a targeted pole piece are obtained, and the slitting parameters comprise an off-cut width and a slitting width and the scanning parameters include a scanning width and a scanning speed; the targeted pole piece is cut according to the slitting parameters to obtain a plurality of pole piece partions, and the width of the pole piece partions are the same as the slitting width; scanning duration of each pole piece partion is computed according to the slitting parameters and the scanning parameters; when the scanned data of the targeted pole piece are received, the scanned data in a scanning duration are identified as quality data correspond to the pole piece partions; and the scanned data includes pole piece thickness data or pole piece weight data. Theembodiment of the invention provides a method for acquiring pole piece quality information, quality information of each elementary volume after the pole piece is cut is acquired, the coating qualityassessment for one elementary volume is realized, and the accuracy of tracing the information of products is improved.

The present invention relates to a method for measuring the weight of a passivation coating composition on a moving substrate with minimal interruption. The method of present invention is especially useful for effective quality control in an industrial setting.

Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.

A method and a device for verifying mass inside a quilt is provided. A top of a box of a write-through device is placed with the quilt, which is unfolded and paved, and which is then put with a transparent platen. The quilt is next gently pressed and fixed by a semi-transparent board of the box, and the box rotates twice and stops at a vertical position. When the quilt is photographed under a write-through condition, one photo which is put in a transparent bag, and the other photo which is a locally exploded picture of the quilt, are attached on proper positions of the quilt.