The present invention relates to an
ultraviolet diode and an
atomic mass analysis
ionization source collecting device using an MCP. In the manufacturing of a portable
atomic mass analyzer, an object of the present invention is to use an MCP
electron multiplier plate, whereby
ultraviolet photons emitted from an
ultraviolet diode are irradiated on a front
surface plate of the MCP
electron multiplier plate to induce primary electrons, an amplified
electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a
discharge time that is accurately controlled. The
atomic mass analysis
ionization source collecting device using an ultraviolet
diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP
electron multiplier plate inducing and amplifying primary electron
discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse
surface plate; an electron condenser lens condensing the electron beam amplified through the MCP
electron multiplier plate; an
ion trap atomic
mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an
ion detector performing detection of ions separated from the
ion trap atomic
mass separator, by means of an atomic
mass spectrum.