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32 results about "3d analysis" patented technology

2D/3D analysis for abnormal tools and stage diagnosis

A method for analyzing abnormalities in a semiconductor processing system includes performing an analysis of variance on a production history associated with each of a plurality of tools at each of a plurality of process steps for each of a plurality of processed wafers, and identifying key process steps. A regression analysis on a plurality of measurements of the plurality of wafers at each process step is performed and key measurement parameters are identified. An analysis of covariance on the key measurement parameters and key process steps, and the key process steps are ranked based on an f-ratio, therein ranking an abnormality of the key process steps. Further, the plurality of tools associated with each of the key process steps are ranked based on an orthogonal t-ratio associated with an analysis of covariance, therein ranking an abnormality each tool associated with the key process steps. The invention also provides 2D / 3D analysis for abnormal tools and stage diagnosis.
Owner:TAIWAN SEMICON MFG CO LTD

3D analysis method used for representing concrete surface washout characteristics

The invention provides a 3D analysis method used for representing concrete surface washout characteristics, belongs to the field of representation of the concrete surface washout characteristics and solves the problem of lack of description of real 3D characteristics after concrete test pieces are washed out and damaged due to the fact that information of 2D planes is analyzed when the concrete surface washout characteristics are represented at present. The technical scheme is characterized in that a concrete test piece of a corresponding structure is selected, manufacturing, form stripping and maintenance of the concrete test piece are performed, and the maintained concrete test piece is pretreated after being maintained for set time; a concrete washout test of the pretreated concrete test piece is completed; 3D morphology feature parameters of concrete surfaces of the concrete test piece at each washout damage stage in the concrete washout test process are acquired; the 3D morphologyfeature parameters are corrected according to the selected structures of the concrete test piece; and the corrected 3D morphology feature parameters are used for representing the washout characteristics of the concrete test piece of the selected corresponding structure.
Owner:CHINA 19TH METALLURGICAL CORP

Methods of Detecting and Monitoring Cancer Using 3D Analysis of Centromeres

The present application relates to a method of detecting and monitoring cancer or precancer in a cell using three-dimensional analysis to assess centromere organization. In addition, the application relates to a method and system for characterizing the 3D organization of centromeres.
Owner:TELO GENOMICS HLDG CORP

A 3D visualization method and system based on real-time dynamic segmentation and reconstruction

The invention discloses a three-dimensional visualization method and system based on real-time dynamic segmentation and reconstruction. The method includes: establishing a cloud database, creating a three-dimensional static scene model of an industrial field; based on the cloud database, reconstructing a three-dimensional real-time dynamic model of an industrial field and drawing a 3D analysis chart; constructing a user interaction interface; achieving three-dimensional visualization of an industrial field based on the user interaction interface. The technical problem that traditional industrial monitoring software is not comprehensive or visual in industrial field data monitoring is solved. Based on industrial field data obtained in real time, A three-dimensional real-time dynamic model and a 3D analysis chart can be generated; the static scene model is used to display the change condition of the data in a more intuitive manner, omnibearing real-time monitoring is carried out on the working condition of the industrial field, 3D visualization of a measurable object of the industrial field is realized, and the method has the advantages of real-time performance, operability, high compatibility and intuition, and is suitable for data monitoring of the industrial field.
Owner:CENT SOUTH UNIV

Film-laminated metal plate having excellent retort adhesiveness, and method for manufacturing same

A film-laminated metal plate having excellent retort adhesiveness includes: a metal plate; a resin film thermally fusion-bonded to a surface of the metal plate; and a bubble contained between the metal plate and the resin film. An average bubble height of three bubbles with higher heights among the bubbles measured by using a 3D analysis image of a laser microscope is 0 μm or more and 5.0 μm or less. The test piece is obtained by cutting a portion of one end side of the metal plate in a longitudinal direction while leaving the resin film on a side which becomes an inner surface side of the container when the film-laminated metal plate is processed into a container. When a retort treatment is carried out on the test piece at a temperature of 125° C. for 30 minutes in a state in which a 100 g weight is hung from the one end side of the test piece and the test piece is folded back toward the other end side of the test piece in the longitudinal direction by 180°, a length of the resin film peeled off from the metal plate of the test piece is 15 mm or less.
Owner:NIPPON STEEL CORP

Near-infrared brain function imager 3D analysis system based on HCT

The invention relates to a brain function detection system, and particularly relates to a near-infrared brain function imager 3D analysis system based on HCT. The system comprises a near-infrared brain imaging device, an HCT cognitive task module, a storage module and a map analysis module, wherein the near-infrared brain imaging device is used for collecting infrared waveform signals of a subject and generating an infrared brain imaging spectrum; the HCT cognitive task module is used for providing high-level cognitive tasks for the subject; the storage module is used for storing the infrared brain imaging spectrum generated by the near-infrared brain imaging device; the map analysis module is used for analyzing and calculating the infrared brain imaging spectrum collected by the near-infrared brain imaging device and is normal; and the high-level cognitive tasks include memory training, operation training, logical thinking training, abstract thinking training and reverse thinking training and are used for comprehensively evaluating the judgment ability, language ability, attention, thinking ability, combination ability and imagination ability of the subject. The infrared brain imaging device based on HCT collects maps based on the HCT cognitive task module, and more remarkable brain imaging map collection can be achieved.
Owner:FIRST HOSPITAL OF SHANXI MEDICAL UNIV

Film-coated product detection system and method based on optical coherence tomography

The invention relates to a film-coated product detection system and method based on optical coherence tomography, and relates to the field of appearance defect detection. The detection method comprises the following steps: S1, placing a film-coated product on a detection platform of a conveying mechanism at a feeding station; S2, enabling a driving device of the conveying mechanism to drive the detection platform to carry the film-coated product to enter a detection station; S3, enabling the optical coherence tomography imaging device to carry out tomography on the film-coated product; S4, after the image processing algorithm module receives a 3D analysis image, processing the 3D analysis image, then carrying out defect identification and classification, and outputting a detection result; S5, enabling the conveying mechanism to drive the detected film-coated product to enter a sorting station; and S6, sorting and classifying. The film-coated product can be automatically detected, and especially the defects can be spatially identified, so that the defects that the film has defects, whether the detected substrate has defects, or whether attachments exist between the film and the detected substrate can be accurately identified.
Owner:CHANGZHOU MICROINTELLIGENCE CO LTD
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