2 results about "Contour length" patented technology

The present invention provides a laminate having high 0.2% yield strength (also referred to simply as yield strength), which is an index of strength against plastic deformation. The laminate, which is a laminate comprising a resin film and a metal layer provided on at least one face of the resin film, satisfies the following relation of Formula (I) with respect to a cross-sectional curve of an interface between the resin film and the metal layer obtained from a cross-sectional image in a thickness direction of the laminate taken by a scanning electron microscope: [∑(Ln / Sn)] / Na ≥ 0.046 (in Formula (I), Ln represents a contour length (nm) of each convex region enclosed by a straight line connecting minimum points between each convex portion of the cross-sectional curve and the cross-sectional curve, Sn represents an area (nm 2 ) of each of the convex regions, and Na represents a total number of the plurality of convex regions), and an evaluation length of the cross-sectional curve is 3,000 nm or more.

A laminate is provided having a high 0.2% yield strength (also simply called yield strength), which is an indicator of strength against plastic deformation. The laminate comprises a resin film and a metal layer provided on at least one side of the resin film, wherein the cross-sectional curve of the interface between the resin film and the metal layer obtained from a cross-sectional image in the thickness direction of the laminate acquired by a scanning electron microscope satisfies the relationship Equation (I): [Σ(Ln / Sn)] / Na≥0.046 [wherein Equation (I), Ln represents the contour length (nm) of each convex region enclosed by the cross-sectional curve and a straight line connecting the minimum points of each convex region of the cross-sectional curve, Sn represents the area (nm²) of each convex region, and Na represents the sum of the number of convex regions], and the evaluated length of the cross-sectional curve is 3,000 nm or more.