An internal error-checking circuit includes a
clock generation circuit, an internal command generation circuit, an address generation circuit, a
control logic circuit, and an error correction circuit. The
clock generation circuit generates and outputs a self-refresh
clock signal in response to a self-refresh enable
signal; the internal command generation circuit counts the self-refresh clock signals when the error-checking enable
signal indicates that an internal error-checking function is enabled and generates and outputs one internal error-checking command signal when the count value of the self-refresh
clock signal is a first preset value; the address generation circuit counts the internal error-checking command signal to generate and output an internal error-checking address; the
control logic circuit controls, in response to the internal error-checking command signal, the error correction circuit to sequentially execute a single internal read-modify-write operation on the target memory cells corresponding to the internal error-checking address in memory arrays.