The present invention relates to the field of
semiconductor detection technology, and discloses: an
ultrasonic detection device for
semiconductor defect detection, comprising: a box body, a
barrel body, a fixed component, a rotating component and a lifting component, the surface of the box body is fixedly connected with a control button, the inner wall of the box body is fixedly connected with an ultrasonic component, the inside of the box body is fixedly connected with the
barrel body, the inside of the box body is provided with a fixed component, the inside of the
barrel body is provided with a driving component, a rotating component and a lifting component, through the coordinated use of an air supply
pipe and a fixed plate, an external gas source is connected with the air supply
pipe, and then the external gas is transported to the inside of the air supply cylinder through the air supply
pipe, thereby driving the fixed cylinder to move, and the fixed cylinder drives the fixed plate to contact with the
semiconductor through a sliding cylinder, when the fixed plate continues to squeeze the semiconductor, the fixed plate squeezes the spring through the sliding cylinder to retract the spring, thereby preventing the fixed plate from damaging the semiconductor, thereby achieving a lossless fixation effect.