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89 results about "Capacitance meter" patented technology

A capacitance meter is a piece of electronic test equipment used to measure capacitance, mainly of discrete capacitors. Depending on the sophistication of the meter, it may display the capacitance only, or it may also measure a number of other parameters such as leakage, equivalent series resistance (ESR), and inductance. For most purposes and in most cases the capacitor must be disconnected from circuit; ESR can usually be measured in circuit.

Device and method of magnetic levitation molecular pump radical protective bearing detection

The invention relates to a device and a method of magnetic levitation molecular pump radical protective bearing detection. The device of the magnetic levitation molecular pump radical protective bearing detection includes an analog rotor which is prepared by insulation materials and loaded into a magnetic levitation molecular pump and capable of driving a radial protective bearing inner ring to revolve, an electric conduction component connected with the radial protective bearing inner ring, and a capacitance meter. The capacitance meter comprises two connecting terminals, wherein a first connecting terminal is connected with the electric conduction component and a second connecting terminal is connected with a pump body. The capacitance meter measures capacitance value between the radial protective bearing inner ring and the pump body. According to the capacitance change situation between the radial protective bearing inner ring and the pump body, the device of the magnetic levitation molecular pump radical protective bearing detection can effectively obtain current information of the protective bearing, prevent the protective bearing from causing terrible accidents. The device of the magnetic levitation molecular pump radical protective bearing detection is high in detection efficiency, low in cost, and capable of effectively avoiding the terrible accidents and relevant economical loss caused by failure of the protective bearing.
Owner:KYKY TECH +1

Method for accumulating aggregate capacitances of smart meter capable of realizing bidirectional metering

ActiveCN102200544AGuaranteed accuracyGuaranteed Accurate AccumulationSpecial tariff metersCapacitanceSmart meter
The invention provides a method for accumulating the aggregate capacitances of a smart meter capable of realizing bidirectional metering, which comprises the steps of accumulating forward and reverse aggregate capacitances, and accumulating the forward and reverse aggregate capacitances of each rate, wherein an energy register adopts a 'read/reset' mode. In the two steps above, only the integer arithmetic is used, but the digital accuracy and the accurate accumulation of aggregate capacitances can be guaranteed, and most of data processing can be completed only by using an addition or subtraction method. In case of applying the method to an MCU (micro-programmed control unit), the cost of metering devices can be reduced, and the calculation speed is faster; and the testing personnel can read the aggregate capacitance metered by an electric energy meter at any time, and compares the metered aggregate capacitance with a standard aggregate capacitance, thereby calculating a metering error. By using the method provided by the invention, the forward and reverse aggregate capacitances can be respectively accumulated according to the requirements of an electric power company, and the combined aggregate capacitance also can be calculated.
Owner:CHINA ELECTRIC POWER RES INST +1

Detection device and method for rebar in concrete

The invention relates to a detection device and method for rebar in concrete, and provides a static field capacitance principle-based low-cost, high-accuracy and nondestructive detection device and method. Various types of targeted detection are implemented on the rebar in the concrete, and an accurate and convenient detection result comprising rebar position, size and corrosion quantity is expected to be acquired, and operation efficiency of detection, building engineering acceptance and detection, reinforcement and identification of an existing rebar concrete structure are improved. The detection device comprises an electrode plate, a DC power supply and a data acquisition processing device, wherein the data acquisition processing device comprises a capacitance meter, a display module, an operation module, a processing module and a data connection line socket, wherein an angular frequency of the capacitance meter is set as 10KHz, the display module is used for displaying a numericalvalue obtained after detection of a capacitance sensor, the operation module is used for performing artificial actual operation and inputting special engineering information to set a parameter, the processing module is used for performing data analysis statistics on the numerical value measured by the capacitance meter and other relevant numerical values, and the data connection line socket is used for connecting the electrode plate.
Owner:QINGDAO TECHNOLOGICAL UNIVERSITY

Suppression method for DC voltage fluctuation based on MMC virtual capacitor

ActiveCN112039106AEnhanced ability to suppress voltage fluctuationsImprove stabilityElectric power transfer ac networkAc-dc conversionCapacitanceControl theory
The invention discloses a method for suppressing DC voltage fluctuation based on an MMC virtual capacitor. The method comprises the steps: controlling electrical parameters of an MMC through a presetcontrol strategy, enabling the control strategy to be equivalent to a virtual capacitor with adjustable capacitance, and adjusting the virtual coefficient of the virtual capacitor according to the amplitude of voltage fluctuation so as to suppress the DC voltage fluctuation. According to the invention, by presetting the control strategy in the MMC, the converter and the virtual capacitor can showa physical behavior similar to the parallel connection of the converter with the capacitor with adjustable size and the direct-current power supply network, and the virtual capacitor shows the behavior of the MMC after the control strategy provided by the invention is carried out; and specifically the virtual capacitance is changed by adjusting the virtual coefficient, so that the inertia of the direct-current power supply network is influenced, the voltage fluctuation suppression capability of the direct-current power supply network can be enhanced, and the stability of the direct-current power supply network is improved.
Owner:EXAMING & EXPERIMENTAL CENT OF ULTRAHIGH VOLTAGE POWER TRANSMISSION COMPANY CHINA SOUTHEN POWER GRID

Capacitance defect detection method based on machine vision

The invention discloses a capacitance defect detection method based on machine vision. The detection method comprises the following steps: step A, image data acquisition: a capacitor is fixed to a motion control system; the motion control system rotates the capacitor; the image acquisition system acquires image data of the surface of the capacitor in the rotating process of the capacitor to obtaina height map and a depth map of the surface of the capacitor; the image acquisition system preprocesses and outputs the image data; B, a capacitor surface coding template is created; and C, defect detection. Compared with the prior art, the capacitor defect detection method has the advantages that the type of the capacitor can be detected, convex hull defects and concave defects on the surface ofthe capacitor can be detected, and only when the type of the capacitor is detected to be qualified, the defect detection system can carry out encapsulation position detection; only when the encapsulation position is detected to be qualified, the defect detection system can detect the surface defects of the capacitor, so that the consistency of the capacitor can be ensured, the capacitor defects can be detected, the reliability and accuracy are high, and the detection speed is high.
Owner:湖南恒岳重钢钢结构工程有限公司

Shock wave pressure measuring device and method for parallel-combined dielectric elastomer

The invention discloses a shock wave pressure measuring device for a parallel-combined dielectric elastomer, and a test method, and the device comprises a base plate and four groups of rectangular sensing units laid on the upper surface of the base plate, wherein four corners of each group of sensing units are fixed on the base plate by angle blocks through screws, the sensing units are composed of a single-layer dielectric elastomer thin film and a flexible conductive cloth both having the upper and lower surfaces evenly brushed with flexible electrodes, the flexible electrode on the upper surface is in screw connection to the screw at the left bottom of the sensing units through the flexible conductive cloth, the flexible electrode on the lower surface is in screw connection to the screwat the right bottom of the sensing units through the flexible conductive cloth, and the bottom end of the screw at the left bottom and the bottom end of the screw at the right bottom of the four groups of sensing units are respectively connected and accessed into a capacitance meter in sequence through wires. At the same time, the invention discloses a test method of the measuring device. The invention improves the accuracy of shock wave pressure measurement by means of parallel combination, and the device has the characteristics of low production cost and simple measurement method.
Owner:XIAN MODERN CHEM RES INST

Enhanced HEMT radio frequency device with gate-drain composite stepped field plate structure, and preparation method thereof

The invention relates to an enhanced HEMT radio frequency device with a gate-drain composite step field plate structure, and a preparation method thereof. A p-GaN region is arranged on the surface of a barrier layer, a gate is arranged on the p-GaN region, a gate step field plate is arranged on the side wall, facing a drain, of the p-GaN region, and a drain step field plate is arranged on the side wall, facing the p-type GaN region, of the drain. The step field plate comprises at least two sub-field plates, and the width of each sub-field plate is gradually reduced from top to bottom. Through the arrangement of the gate-drain composite step field plate, the electric field distribution of the side, close to the drain, of the gate and the electric field distribution of the side, close to the gate, of the drain are changed, the average electric field intensity between the gate and the drain is improved, and the voltage withstanding performance and reliability of the device are improved; and the p-GaN region is arranged below the gate, and the enhanced HEMT radio frequency device has smaller gate-drain capacitance and shows higher cut-off frequency in combination with the gate-drain composite step field plate structure.
Owner:SOUTH CHINA NORMAL UNIVERSITY

Measuring method for capacity parameters of each chip on silicon chip

The invention provides a measuring method for capacity parameters of each chip on a silicon chip, comprising the steps of selecting a tested silicon chip, transferring a measuring probe of a capacitance meter to be above each chip on the tested silicon chip to carry out a new round of non-contact idle measurement, so as to obtain zero capacitance data of each chip in different positions on the tested silicon chip under current measurement environment; providing a to-be-tested silicon chip, enabling the measuring probe to respectively contact with each chip on the to-be-tested silicon chip to carry out formal measurement, wherein after each chip is measured, subtracting the measurement value by the zero capacitance data of the chip in the same position on the tested silicon chip, so as to obtain the actual capacitance of each tested chip on the to-be-tested silicon chip; comparing the actual capacitance of each tested chip after calculation zero setting with a code value respectively, judging whether the chip is qualified or not, and recording and storing as data. According to the invention, distribution effect and parasitic effect of capacitance of the back and the surface of the silicon chip can be overcome, quick and accurate measurement can be carried out on small capacitance parameters of each chip on the silicon chip, and the requirement of mass production can be met.
Owner:ADVANCED SEMICON MFG CO LTD
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