31 results about "Cantilever deflection" patented technology

A phase feedback AFM (atomic force microscope) and method for the phase feedback AFM. A cantilever is driven to oscillate at a constant frequency close to the resonance frequency of the cantilever by a driving signal. The distance between the probe and the sample is controlled such that the phase difference between the driving signal and a cantilever deflection signal indicating deflections of the cantilever is kept constant. The phase feedback AFM has an amplifier-controller for receiving the cantilever deflection signal, the output from an oscillator for driving the cantilever into oscillation, and a signal representing a reference amplitude of oscillation of the cantilever. The phase feedback AFM further includes a feedback circuit which receives the output from the amplifier-controller which controls the cantilever deflection signal to a preset amplitude.

An approach to detect when a cantilever loses interaction with a sample, thereby detecting when a portion of an image obtained using a cantilever is spurious is presented. An observer based estimation of cantilever deflection is compared to the cantilever deflection and the resulting innovation is used to detect when the cantilever loses interaction. The loss of interaction is determined when the innovation is outside of and / or below a threshold level.

The present invention is a method and system for erecting a steel truss beam assisted by a cable-stayed full cantilever. The method uses a sling tower combined with a steel structure central tower column and a cable-stayed cable; The tower crane on the top of the end of the truss girder; after the anchor boxes of the front and rear cable stays are connected with the lug plates of the steel girder joints, the tower is directly lifted to apply the pretension of the cable stays; Cantilever erection. After the hole steel girder is erected, use the method of raising the temporary support of the front pier and lifting equipment between the upper and lower supports of the sling tower to complete the cable force unloading of the stay cables. The system includes tower auxiliary truss, tower center column, upper and lower support bases, front and rear stay cables, stay cable upper and lower anchor boxes, tower top anchor beams and running mechanism. Advantages: For large-span continuous steel truss girders, a special equipment is used to assist the erection of multi-span steel truss girders, which can reduce the internal force of steel truss girder member installation, reduce the deflection of the front outrigger end, and increase the roll stability of the outrigger steel truss girder sex. And the investment is small, the cycle is short; the operation is very convenient.

An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

A high precision micro / nanoscale machining system. A multi-axis movement machine provides relative movement along multiple axes between a workpiece and a tool holder. A cutting tool is disposed on a flexible cantilever held by the tool holder, the tool holder being movable to provide at least two of the axes to set the angle and distance of the cutting tool relative to the workpiece. A feedback control system uses measurement of deflection of the cantilever during cutting to maintain a desired cantilever deflection and hence a desired load on the cutting tool.