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37 results about "Raw bit error rate" patented technology

The bit error rate (BER) is the number of bit errors divided by the total number of bits transferred. The data transfer error is usually corrected with ECC in computing, and thus keeping the data more safe and accurate. The raw bit error rate (RBER) is the number of bit errors without ECC checksum divided by the total number of bits transferred.

Method and apparatus for estimating random jitter (RJ) and deterministic jitter (DJ) from bit error rate (BER)

An apparatus and method provides prediction of BER for an interface between ICs, such as a processor and a memory device, without using special test equipment. A known data pattern or PRBS is transmitted to a receiver, which compares the received data values with expected data values to determine if a bit error has occurred in an embodiment of the present invention. A center of data eye and the edge of the data eye are sampled (over sampled) in order to determine if a bit error has occurred in an alternate embodiment of the present invention. A first counter is used to count the total number of bits sampled and the second counter is used to count the number of errors that occurred in the total number of bits sampled. In an embodiment of the present invention, the first and second counters are logarithmic counters that include overflow protection. The counter values are output to a processing device to perform the BER calculation in an embodiment of the present invention. A plurality of BER values is then obtained for corresponding offsets. A subset of the plurality of BER values corresponding to the plurality of offsets is selected. An inverse of the standard normal cumulative distribution (NormSlnv) function for respective BER values is calculated. Two linear fits on the transformed BER values and offsets are performed to obtain the x-intercepts that correspond to a DJ component and the slopes corresponding to a RJ component. The DJ and RJ components are used with the Fibre Channel jitter model equation to predict BER as a function of transition density and offset value.
Owner:RAMBUS INC

Data recovery method and system used for flash memory

The application discloses a data recovery method and system used for a flash memory. The method includes: reading original data on the basis of default reading voltage when the flash memory receives areading command; carrying out ECC (Error Correcting Code) checking on the original data, and judging whether a first error number is greater than maximum ECC error-correction capability; when the first error number is greater than the maximum ECC error-correction capability, determining rereading voltage by rereading error-correction, carrying out ECC checking on data read by the rereading voltage, and judging whether a second error number is greater than the maximum ECC error-correction capability; and when the second error number is greater than the maximum ECC error-correction capability,carrying out compensation on threshold voltage of a storage unit, and obtaining optimal reading voltage by rereading error-correction until a third error number after ECC checking on data read by theoptimum reading voltage is less than or equal to the maximum ECC error-correction capability. The method is capable of recovering flash memory data by combining data rereading and compensation, and effectively reduces an original bit error rate as compared with the prior art.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

Equivalent residence time recovery method and device, storage medium and electronic equipment

The invention relates to the technical field of data storage, and provides an equivalent residence time recovery method and device, a storage medium and electronic device.The method comprises the steps that when a first storage breaks down, whether the fault category of the first storage belongs to a preset first fault category set or not is judged; if yes, periodically acquiring the temperature of the first memory, and recording time-temperature information of the first memory at each acquisition moment; when the first memory resumes working, calculating an equivalent residence time compensation value during the failure of the first memory according to the time-temperature information and sending the equivalent residence time compensation value to the first memory, or sending the time-temperature information to the first memory, and calculating the equivalent residence time compensation value by the first memory according to the time-temperature information; and recovering the equivalent residence time according to the compensation value. According to the invention, the equivalent residence time during the fault period of the memory can be accurately compensated and recovered, and the original bit error rate is reduced while the reading speed of the memory is improved.
Owner:DERA CO LTD

A data recovery method and system for flash memory

The application discloses a data recovery method and system used for a flash memory. The method includes: reading original data on the basis of default reading voltage when the flash memory receives areading command; carrying out ECC (Error Correcting Code) checking on the original data, and judging whether a first error number is greater than maximum ECC error-correction capability; when the first error number is greater than the maximum ECC error-correction capability, determining rereading voltage by rereading error-correction, carrying out ECC checking on data read by the rereading voltage, and judging whether a second error number is greater than the maximum ECC error-correction capability; and when the second error number is greater than the maximum ECC error-correction capability,carrying out compensation on threshold voltage of a storage unit, and obtaining optimal reading voltage by rereading error-correction until a third error number after ECC checking on data read by theoptimum reading voltage is less than or equal to the maximum ECC error-correction capability. The method is capable of recovering flash memory data by combining data rereading and compensation, and effectively reduces an original bit error rate as compared with the prior art.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

Interleaving and error-correcting method for reducing bit error rate of volume hologram storage system

ActiveCN102006088BEliminate the effects of uneven bit error rate distributionReduce bit error rateError correction/detection using interleaving techniquesOriginal dataThree dimensionality
The invention relates to an interleaving and error-correcting method for reducing bit error rate of a volume hologram storage system, comprising the following steps of: (1) firstly, carrying out error correction coding on data to be stored from three dimensionalities including a row direction, a line direction and among data pages; (2) after error correction coding, carrying out matching interleaving within data pages, and then carrying out block interleaving among the data pages to rearrange the sequence among the data pages; and (3) restoring the data obtained in the volume hologram storagesystem into original data by sequentially carrying out detection and postprocessing, demodulation and de-interleaving, and clearing error correction codes. In the invention, because the methods of matching interleaving among within pages and block interleaving among data pages are adopted and the Reed Solomon error correcting code is used for error correction from three dimensionalities, the influence of nonuniform distribution of bit error rate within pages and among data pages is eliminated, burst errors are overcome, random errors are corrected, and iteration decoding can be carried out inthree directions so that the bit error rate after correction is greatly reduced. The invention can be widely applied in various error modes of volume hologram storage channels.
Owner:TSINGHUA UNIV
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