61 results about "Quad Flat Package" patented technology

A digital core embodied within a semiconductor die is situated within any of a variety of integrated circuit packaging technologies including but not limited to Ball Grid Array or Quad Flat Pack surface mount technology. Said semiconductor die is of the variety that requires plural separate power supply voltage domains such as a digital core supply of differing voltage than the input/output pad ring supply voltage. Within the integrated circuit package including said semiconductor die also exists a high efficiency DC-to-DC voltage converter of type commonly known as a chopper or a switch mode power supply. In the preferred embodiment this switch mode power supply would be of the highest efficiency, a synchronous step-down regulator, thus to enable powering the entire integrated circuit from one supply voltage. The components contained within the integrated circuit package along with the semiconductor die include the majority if not the totality of the components comprising the switch mode power supply, which could include the power switching transistors; an inductor core and windings; the output voltage fixing circuitry; the output capacitor; and the substrate for mounting said components when integrated within a packaging technology that does not already include a substrate such as within the periphery of a lead frame for leaded devices.

A stacked semiconductor die assembly includes at least two partially offset semiconductor dice with bond pads located adjacent at least one peripheral side thereof supported on a redistribution element formed of a material of substantially similar CTE to that of the dice, and a paddle-less lead frame secured to the redistribution element during fabrication, including encapsulation. The assembly is configured to be substantially vertically symmetrical with respect to inner ends of lead fingers of the lead frame to facilitate uniform encapsulant flow. The semiconductor die assembly may be configured in a package with leads extending from two sides thereof, such as a thin small outline package (TSOP), or four sides thereof, such as a quad flat pack (QFP).

An test block includes a box-like body and four rails extending from side edges of the body. During thermal testing, the test block is mounted between a test head and a test socket such that the rails provide a thermal path between the test block body and contact pads formed on the test socket. In this manner the rails emulate the thermal path formed by the metal leads extending from a conventional Quad Flat Pack Integrated Circuit (QFP IC), thereby reliably duplicating the actual thermal path of the QFP IC. The test block is mounted on the test system and its temperature is measured before and after testing QFP IC devices. Confirming that the test block is within test temperature specifications before and after the QFP-IC test procedure provides a highly reliable verification that the QFP-IC's actual test temperature is within the test temperature specifications.

The invention relates to packages of semiconductor devices, specifically of the surface mount and Quad Flat Pack families, that can be used in current semiconductor device production, and to a method of automated testing. The packages have a plurality of insulating tie bars supporting a multitude of leads. The tie bars are designed so that they comprise celectrically conductive vias in a pattern expanding the effective lead pitch for more convenient testing, without introducing unwanted side effects. The full benefit of the expanded lead pitch can be exploited during the electrical testing of the device which utilizes a test apparatus simplified for an automated testing procedure. The base of the apparatus includes a multitude of electrically conductive and mechanically elastic passageways with surface contours adapted for contacting the metallic end connectors of the semiconductor device-to-be-tested, as well as the metallic connector to the tester.

The present invention implements a mechanism using an inter-connection layer to couple a plurality of integrated circuit devices to a printed circuit board, thereby eliminating the need for sockets to hold the integrated circuit devices on the printed circuit board. The mechanism of the present invention is operative for integrated circuit devices packaged in a ball grid array, a quad flat pack or a leadless quad flat pack. The present invention also provides a mechanism to efficiently transfer a plurality of integrated circuit devices from an integrated circuit device delivery tray to a burn-in board in a single process without requiring an autoloader, resulting in increased transfer reliability and both cost and space savings.

The invention discloses an e/LQFP (low-profile quad flat package) planar package with a grounded ring, which comprises a carrier and the grounded ring, wherein one to two IC (integrated circuit) chips are adhered to the carrier. The IC chips are connected with an inner pin through bonding wires, the inner pin is connected with an outer pin, the lower end face of the grounded ring is higher than the upper end face of the carrier, and the carrier is connected with the grounded ring through a ribbed plate. The end face, without the IC chips, of the carrier is provided with an anti-overflow ring, the grounded ring, the bonding wires, the ribbed plate and the inner pin are packaged in a plastic packaging part which is fixedly packaged on the carrier, the outer pin is positioned outside the plastic packaging part, the outer pin and the plastic packaging part are coplanar, and the lower end face of the carrier is positioned outside the plastic packaging part or packaged inside the plastic packaging part. The e/LQFP planar package with the grounded ring is produced by procedures of wafer thinning, scribing, coring, bonding and the like. Layering or shedding of a ground wire caused by making the ground wire on the carrier can be avoided, the carrier is free of silver coating, and packaging reliability is improved.

The invention discloses an e/LQFP (low-profile quad flat package) stacked package with a grounded ring and a production method of the e/LQFP stacked package with the grounded ring. Two IC (integrated circuit) chips are adhered to a carrier in a stacked manner and connected with an inner pin through bonding wires, the inner pin is connected with an outer pin, the carrier is connected with the grounded ring through a ribbed plate, and the lower end face of the grounded ring is higher than the upper end face of the carrier. The lower end face of the carrier is provided with an anti-overflow ring, the grounded ring, the bonding wires, the ribbed plate and the inner pin are packaged in a plastic packaging part, the lower end face of the carrier is packaged in the plastic packaging part or positioned outside the plastic packaging parte. A wafer is thinned and scribed prior to being subjected to coring, bonding, plastic packaging and subsequent procedures to produce the e/LQFP stacked packaging part with the grounded ring. The carrier of the stacked packaging part is free of ground wire, layering caused by stress generated by making the ground wire and bonding failure of the ground wire can be avoided, and thereby reliability and testing yield of the package are improved.

A quad flat package integrated circuit (IC) device has alternating inner and outer leads that protrude from a package body. The inner leads are j-shaped leads and the outer leads are gull-wing shaped leads. The package body is formed such that it includes plastic lead webbings between adjacent leads, which help prevent metal particles from getting lodged between the leads and causing electrical shorts. The webbings are made of the same molding compound as the package body and are formed together with the package body.

An electronic package is provided. The electronic package comprises a die pad having a die attached thereon. A plurality of leads surrounds the die pad and spaced therefrom to define a ring gap therebetween. At least one first common electrode bar is in the ring gap and substantially coplanar to the die pad, in which at least one of the plurality of leads extends to the first common electrode bar. A molding compound partially encapsulates the die pad and the first common electrode bar, such that the bottom surfaces of the die pad and the first common electrode bar are exposed. A length of the first common electrode bar is substantially equal to a predetermined distance between two pads among a plurality of power or ground pads on a side of the die facing the first common electrode bar. An electronic device with the electronic package is also disclosed.

Provided are semiconductor devices and methods for configuring lead frames and/or device bonding pads to provide for the independent adjustment of the electrical characteristics of both fixed voltage lines, e.g., V_dd and V_ss, and the signal lines, e.g., command, clock, data and address. In particular, the invention provides for adjusting the relative sizing of leads corresponding to fixed voltage lines and signal lines for increasing the relative capacitance on the fixed voltage lines to improve their stability will reducing the noise on the signal lines. The invention may be utilized with a variety of package configurations including lead-on-chip LOC configurations, more conventional quad flat pack QFP configurations in which the leads do not extend past the perimeter of the semiconductor chip or hybrid configurations in which some leads do extend past the perimeter of the semiconductor chip and across the active surface.

A load board for packaged IC testing. The load board with predetermined testing circuit thereon has bonding pad areas on its surface. A plurality of bonding pads is formed on the bonding pad areas, each of which is disposed corresponding to a lead of a packaged IC for testing connection, such as a quad flat packaged IC (QFP), a dual inline packaged IC (DIP) or a small outline packaged IC (SOP). The bonding pads on the load board connect the leads of the testing IC directly during IC testing, thus the conventional test socket between a conventional load board and a packaged IC is omitted.

A Quad Flat Package (QFP) semiconductor device has a multi-stepped lead frame for forming rows of external contacts. A semiconductor die is attached to a die pad of the lead frame and electrically connected to lead with bond wires. The die and bond wires are encapsulated with a mold compound and then multiple cuts are made to the lead frame to form the rows of external contacts.

The invention discloses a ceramic quad flat package (CQFP) series aging test socket with pitch being no less than 0.8mm. The CQFP series aging test socket comprises an installation plate and a cover plate which are movably hinged through a hinge shaft. The CQFP series aging test socket is characterized in that a torsion spring is sheathed on the hinge shaft, a clamping block which is in clamping fit with the installation plate is arranged at the end part of the cover plate, contact pieces with quantity being equal to the quantity of leads of a package are installed on the installation plate, the upper end of each contact piece is a contact end, the lower end of each contact piece is a welding end, the two sides of the middle part of each contact piece are respectively provided with a press fitting part and each press fitting part is provided with a barb. The back surface of the cover plate of the CQFP series aging test socket is provided with teeth, wherein the quantity of the teeth is equal to the quantity of the contact pieces and the width of the teeth is less than the slot width of the installation plate and is more than the width of the leads of the package. The teeth are used for providing enough pressure to the leads of the package through the contact pieces. The upper surface and the lower surface of the cover plate are provided with a plurality of process slots. The CQFP series aging test socket can be used for the aging test of the package both before forming and after forming, and is easy to machine and assemble. The structure of the CQFP series aging test socket is a novel structure which is designed according to the structural characteristics of the package, the package is convenient to place and position and the package can be well protected during testing.

An integrated circuit package system includes: providing a base package having a first integrated circuit with an inner lead on a periphery thereof and connected thereto with interconnects, and the inner lead partially encapsulated by an inner encapsulation; mounting an outer lead on the periphery of the base package; mounting a second integrated circuit above the base package and connected to the outer lead with the interconnects; and partially encapsulating, the base package and the outer leads with an outer encapsulation leaving a bottom surface of the inner lead and a bottom surface of the outer lead exposed.

The invention provides a method for manufacturing a quad flat no-lead package, comprising the following steps: providing a motherboard; forming a mold layer on the upper surface of the motherboard; forming a through hole penetrating to the upper surface of the motherboard on the surface of the mold layer, The opening area of ​​the through hole close to the upper surface of the motherboard is smaller than the opening area of ​​the other side; the chip tray and the chip electrode are formed in the through hole; the chip is fixed on the surface of the chip tray; between the chip and the chip electrode forming electrical leads between them; forming a plastic package on the upper surface of the motherboard; removing the motherboard to expose the chip tray and chip electrodes embedded in the plastic package.

The invention belongs to the QFP (Quad Flat Package) field and particularly relates to a QFP grounding welding plate. The QFP grounding welding plate comprises a heat radiating hole and a matrix arrangement hole, wherein the heat radiating hole is positioned in the middle of the grounding welding plate; and the matrix arrangement hole is positioned on the grounding welding plate and bypasses the heat radiating hole. The thickness of the periphery of the grounding welding plate is larger than that of the middle part of the grounding welding plate; solder paste is filled in the matrix arrangement hole; the thickness of the middle part of the grounding welding plate is 0.15-0.18 millimeter; the thickness of the periphery of the grounding welding plate is 0.3-0.4 millimeter; and the matrix arrangement hole is square or circular or triangular. The QFP grounding welding plate has the beneficial effects that as the heat radiating hole positioned in the middle of the grounding welding plate, the grounding welding plate has good heat radiation; and meanwhile, as the periphery of the grounding welding plate is thickened to 0.3-0.4 millimeter, a proper amount of solder paste is moistened and diffused to the whole grounding welding plate and does not generate solder balls, so that the grounding requirements are satisfied.

The invention discloses a tray for a low-profile quad flat package (LQFP) integrated circuit. The tray comprises a first frame and a flat plate, wherein the flat plate and the first frame form an upper frame body and a lower frame body; the upper frame body is internally provided with a plurality of first structural ribs and a plurality of second structural ribs; the first structural ribs and thesecond structural ribs are vertical to one another; the first structural ribs, the second structural ribs and the rim of the upper frame body encircle a plurality of storage containers; a base is arranged in each storage container, and a gap is reserved between the side face of the base and the inner wall of the corresponding storage container; the end faces of the bases are provided with segmental limiting ribs in a number the same as that of the side faces of the bases, and the segmental limiting ribs correspond to the side faces of the bases one to one; the segmental limiting ribs are shorter than the side edges of the bases; locators in a number the same as that of the bases are arranged in the lower frame body; and second limiting ribs are arranged on the end faces of spaced side walls of the locators respectively. The tray is simple in structure and easy to manufacture, and can prevent damage to the LQFP package integrated circuit during production and use and realize automatic operation.