The application relates to the computer technical field, in particular to a
system fault-tolerant test method, an electronic device and a storage medium. In the
system fault-tolerant test method, the function
characteristic type information and the disaster
simulation program are acquired first, then the cloud platform
system to be tested is divided into levels based on the function
characteristic type information, a cloud system hierarchical model corresponding to the cloud platform system is obtained, further, a data disaster environment is simulated in the cloud system hierarchical model based on the disaster
simulation program, finally, the cloud system hierarchical model in the data disaster environment is tested for
fault tolerance, and fault-tolerant indexes corresponding to the cloud platform system are obtained. Through the system fault-tolerant test method, the data disaster of the cloud platform system is simulated based on the cloud system hierarchical model, so that the fault-tolerant indexes of the cloud platform system are obtained through the fault-tolerant test, and the fault-tolerant indexes of the cloud platform system can be more accurately measured.