33 results about "Dual focus" patented technology

A CT system includes a rotatable gantry having an opening for receiving an object to be scanned, at least one x-ray source coupled to the gantry and configured to project x-rays toward the object, a detector coupled to the gantry and having a scintillator therein and configured to receive x-rays that pass through the object, and a generator configured to energize the at least one x-ray source. The system includes a controller configured to energize the generator to project a first beam of x-rays toward the object from a first focal spot position of an anode, the first beam of x-rays having a ray traversing a path through the object, acquire imaging data from the first beam of x-rays, position the at least one x-ray source such that a second beam of x-rays projected from a second focal spot position of the anode has a ray directed to traverse the path through the object, the second anode focal spot position different than the first anode focal spot position, energize the generator to project the second beam of x-rays toward the object, and acquire imaging data from the second beam of x-rays.

A dual field-of-view optical imaging system is provided for obtaining two images of a scene, each image having a different field of view. The dual field-of-view optical imaging system includes a frontal dual focus lens, the dual focus lens having a central zone of focal length f1 producing a wide field-of-view image at a first focal plane and a peripheral zone of focal length f2 greater than f1 producing a narrow field-of-view image at a second focal plane; and a detector for detecting and acquiring the wide field-of-view image and the narrow field-of-view image, the detector being movable along an optical path for selective positioning at the first focal plane or the second focal plane.

The system and the method of the present invention differ from the prior art in that radii of curvature of any length of spherical and cylindrical test surfaces can be optically measured, with only a supplementary dual-focus lens being required in addition to an interferometer or an autocollimator. The supplementary dual-focus lens has a first focal plane, into which the surface vertex of the test surface is positioned, which establishes the cat's eye position (P(cat)), and a second focal plane into which the center of curvature of the test surface is moved, which establishes the autocollimation position (P(aut)) for the test surface. The radius of curvature of the test surface is determined from the distance between the focal planes (D(foc)) and the path of movement which can be reduced to zero.

Methods of and apparatuses for dicing semiconductor wafers, each wafer having a plurality of integrated circuits, are described. In an example, a method of dicing a semiconductor wafer having a front surface having a plurality of integrated circuits thereon involves forming a mask layer above the front surface of the semiconductor wafer. The method also involves laser scribing the mask layer and the front surface of the semiconductor wafer to provide scribe lines in the mask layer and partially into the semiconductor wafer. The laser scribing involves use of a dual focus lens to provide a dual focus spot beam. The method also involves etching the semiconductor wafer through the scribe lines to singulate the integrated circuits.

The invention discloses a dual focusing beam forming method and device based on virtual array elements. The method comprises the following steps of: performing primary focusing by using a single fixed focus; calculating a delay parameter of secondary focusing by using the concept of the virtual array elements; and performing secondary focusing according to the principle of delay-and-sum (DAS) beam forming and the dynamic focusing technology to acquire finally imaged scanning line data. Dual focusing beam forming ultrasonic imaging is realized by introducing the virtual array element technology to an ultrasonic imaging system, using a DAS beam synthesis method and performing DAS twice. The method is characterized in that related valid information of a plurality of superposed sound fields is extracted by performing DAS twice, so that information quantity and energy of sound wave signals are increased, and the imaging effect is greatly improved. According to the method, two beam formers BF1 and BF2 and a first in first outlet (FIFO) buffer are used and DAS is performed twice, so that a large quantity of low-resolution echo data is not required to be stored.

The invention relates to a lens and a manufacturing method thereof, and in particular relates to a compound polarizing lens and a manufacturing method thereof. The compound polarizing lens comprises a PVA polarizing film, a TAC substrate and a resin lens; the PVA polarizing film is fitted with the TAC substrate to form a compound layer; the compound layer is attached on the inner surface or the outer surface of the resin lens; the PVA polarizing film is arranged between the TAC substrate and the resin lens substrate. The structure of the lens has the advantages of both the traditional TAC polarizer and resin polarizer, but no disadvantages of the two polarizers; in combination with the adjustment of the bending of the lens structure and different numbers of degrees of the resin lens, various single-focus (shortsightedness, astigmatism and the like), dual-focus and multi-focus optical polarizing lenses can be formed conveniently; based on the characteristic of easy setting of the resin lens and the characteristics of convenience in processing and reasonable polarizing structure of the TAC and the PVA, a new structure lens can be formed; the new structure lens has the advantages of the resin lens, the TAC and the PVA, and is capable of meeting the requirements of almost all polarizing lenses.

The invention discloses an image classification method, system and electronic equipment based on a dual attention mechanism. Using an improved self-attention model, the attention weights of the feature map space dimension and the feature map channel dimension are simultaneously calculated, and then the two kinds of attention The feature maps generated by the force mechanism are added together to complete the end-to-end image classification network construction, improve the network's adaptive perception of salient areas, achieve more accurate and robust image feature expression, and then improve image classification performance.

The present invention relates to a dual focusing optical coherence imaging system. The dual focusing optical coherence imaging system includes: a light source unit for generating broadband light; a main optical distributor for distributing the light generated from the light source to allow the light to be propagated; an interference unit including first and second interference parts for forming interference signals with respect to different focused areas of an object to be detected using the light distributed from the optical distributor, and a common sample arm commonly connected to the first and second interference parts; an optical switch connected to the first and second interference parts to select at least one of the interference signals transmitted from the first and second interference parts; and a detection unit for converting the interference signal selected by the optical switch according to a preset mode into an electrical signal.

A double-focusing ultrasonic probe (1) and a sparse array photo-acoustic tomography system. The probe (1) comprises a recessed detection face (11), and a numerical aperture of the recessed detection face (11) in a first direction (13) is greater than that in a second direction (12), so that a signal receiving angle of the recessed detection face (11) in the first direction (13) is greater than that in the second direction (12), and the length of a focused area of the recessed detection face (11) in the second direction (12) is greater than that in the first direction (13), wherein the first direction (13) is perpendicular to the second direction (12).

The present invention provides a network version team intelligence explanation transmitter and system structure and positioning and switching methods. The explanation transmitter includes: a core control unit, and a display module, a power supply module, an infrared module, and a WIFI module respectively connected to the core control unit. module, bluetooth module, audio transmission module and data transmission module. Compared with the previous explaining transmitter, the present invention has more intelligent and diversified functions: it realizes the real-time management and control of the tour guide and tourists by the background center, and the real-time control of the tourists by the tour guide; it has the ability to automatically optimize functions according to environmental changes, double replay mode, and network connection , Automatic reminder of explanation words, real-time recording, online explanation and recording and broadcasting explanation and other functions.

The invention relates to the technical field of laser processing, and discloses a dual-focus laser micro-processing device and a processing method thereof. The processing device includes a laser, a first 45-degree reflector, a first half-wave plate, a third 45-degree reflector and a focusing mirror, which are arranged on the output optical path of the first half-wave plate for splitting the laser beam into horizontally polarized beams P and the first polarizer of the vertically polarized light beam S, the horizontal optical path device and the vertical optical path device respectively arranged on the horizontal polarized optical path and the vertical polarized optical path, the second polarizer arranged at the output end of the horizontal optical path device and the output end of the vertical optical path device, horizontal The polarized beam P passes through the horizontal polarized optical path, the second polarizer, the third 45-degree mirror and the focusing mirror in turn to form the first focal point on the workpiece, and the vertically polarized beam S sequentially passes through the vertical polarized optical path, the second polarized sheet, the second Three 45-degree mirrors and a focusing mirror form a second focal point on the workpiece. The invention has the advantages of high processing efficiency and good effect.

The invention discloses a magnetic deflection mass spectrometer based on a cylindrical electric field analyzer, and belongs to the technical field of instruments. The magnetic deflection mass spectrometer mainly comprises an ion source, a first slit, a cylindrical electric field analyzer, a second slit, a magnetic field analyzer and an ion flow detector; wherein, the cylindrical electric field analyzer and the magnetic field analyzer are connected in a reversed series connection; the magnetic deflection mass spectrometer ensures mutual offset of energy dispersion generated by magnetic fields and electric fields, so that the magnetic deflection mass spectrometer has dual focusing capability of energy and direction, and distinguishing ability is substantially improved.