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30results about How to "Effective forecast" patented technology

Method for detecting semiconductor device electrical property failure

The invention discloses a method for detecting a semiconductor device electrical property failure. The method for detecting the semiconductor device electrical property failure comprises the following steps of: S1, collecting the gray scale: a. taking the minimum region which can be scanned by an electron beam defect scanner as a scanning unit region, setting as a defect through a program form and detecting the defect, and shooting an electron microscope atlas; and b. taking a semiconductor device as a scanning object, scanning under different conditions, and analyzing the gray scale; S2, screening scanning conditions, and testing the electrical property of the scanning conditions; acquiring a similarity numerical value; and defining the optimal scanning condition; S3, carrying out fixed point gray scale analysis so as to obtain a gray scale data collecting interval with an effective electrical property; and S4, forecasting an electrical property failure region. According to the invention, the gray scale collected data obtained by the electron beam defect scanner and the electrical property testing data are compared, the electrical property failure region and an electrical property effective region can be forecast effectively, which provides a basis for monitoring the advantages and disadvantages of an ion implantation technology, provides a technical support for to-be-adopted improving measures, and provides a powerful guarantee for shortening the research cycle of the semiconductor device.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

A method for forecasting the fishing situation of Symplectoteuthis australis in the South China Sea

InactiveCN109165766AEffective forecastAchieving short-term forecastsForecastingShort termsFishing
The invention provides a method for forecasting the fishing situation of Symplectoteuthis australis in the South China Sea, which comprises the following steps: different points are selected in the sea area where the fishery situation prediction of Symplectoteuthis australis needs to be carried out, and environmental factors affecting the habitat quality of Symplectoteuthis australis at corresponding positions are obtained; the environment factors affecting the habitat quality of Symplectoteuthis australis are analyzed; according to the model of different seasons and different environmental factors and adaptability index, the adaptability index of the selected point position is obtained; according to the model of habitat adaptability index and seasonal adaptability index, the habitat adaptability index of selected sites is obtained; the habitat adaptability index distribution map of Symplectoteuthis ulna is obtained by image processing of habitat adaptability index corresponding to theselected points in the fishery forecasting sea area, and the range of Symplectoteuthis ulna fishery could be predicted. The method of the invention can make short-term prediction of the fishery situation of the South China Sea kite squid and reflect the habitat change of the cephalopod resources in a short time, and the accuracy rates of forecasting the fishery situation of the South China Sea kite squid in different seasons are 83%, 86%, 88% and 90%, respectively.
Owner:SOUTH CHINA SEA FISHERIES RES INST CHINESE ACAD OF FISHERY SCI

Weather forecast system for power production

The invention discloses a weather forecast system for power production. The weather forecast system comprises a data layer, a logic layer and an application layer; meteorological monitoring data is processed by using a business service module and an analysis model module, conventional meteorological forecast information is firstly obtained, and then electric power professional downscaling numerical meteorological forecast information is obtained by using a power transmission line power downscaling method; wind damage forecast information and galloping forecast information are obtained by combining power grid GIS data, power grid PMS data and power transmission and transformation line monitoring data on the basis of power professional downscaling numerical weather forecast information; electric power professional meteorological disasters are accurately focused, local surface features and near-surface meteorological factor data are accurately obtained, and forecasting and early warning of the electric power meteorological disasters are effectively achieved; related forecasting and early warning are based on conventional meteorological products and electric power professional conventional meteorological products, and an effective correlation model between meteorological related power grid disasters or faults and meteorological factors is established, so that meteorological disaster effective early warning oriented to power grid risks is realized.
Owner:STATE GRID HENAN ELECTRIC POWER ELECTRIC POWER SCI RES INST +2

Transverse prestress reinforcement method of railway simply-supported T beam

The invention discloses a transverse prestress reinforcement method of a railway simply-supported T beam. The transverse prestress reinforcement method comprises the following steps: S1, the steel barposition of a main beam web of the railway simply-supported T beam is detected; S2, hole position drilling of a transverse prestress steel beam is conducted; S3, common steel bars are anchored; S4, the steel bars are pre-tightened; S5, the transverse prestress steel beam is mounted; S6, a formwork is mounted; S7, the transverse prestress steel beam is primarily pulled; S8, the transverse prestress steel beam is finally pulled, specifically, the transverse prestress steel beam is pulled after the concrete strength reaches 75-85%, pulling is conducted in two steps, and pulling force each time is 190-200 kN; and S9, anchor sealing is conducted, specifically, anchor sealing is conducted through C50 reinforced concrete. According to the transverse prestress reinforcement method, through a finite element analysis method of the transverse reinforcement effect of the railway simply-supported T beam, the self-vibration frequency after reinforcement can be accurately estimated, and increasing of the bridge transverse stiffness is promoted through the transverse prestress reinforcement method.
Owner:中铁科学研究院有限公司

Multi-source water conservancy project image information system

The invention belongs to the technical field of water conservancy project management, and particularly relates to a multi-source water conservancy project image information system. The system comprises a terrain data information acquisition module, a terrain model construction module, an acquisition scheme design module, an acquisition scheme simulation test module and an acquisition scheme feasibility estimation module. The topographic data information acquisition module acquires related data information of a region to be acquired through internet big data, and performs preliminary entity investigation and determination according to the data; the terrain model construction module constructs an on-site operation model of the region to be acquired according to the internet big data and theon-site preliminary acquisition data; and the acquisition scheme design module constructs an on-site operation model through observation. According to the invention, based on big data, the topographicinformation of a region to be measured can be effectively estimated, a simulation test is carried out on an acquisition scheme, the acquisition scheme can be judged in advance, topographic acquisition is carried out according to the acquisition scheme with relatively high feasibility, and the image data acquisition accuracy can be effectively improved.
Owner:许艳杰

Method for judging gas abnormality by utilizing gas desorption quantity characteristics

The invention relates to a method for judging gas abnormality by utilizing gas desorption quantity characteristics, which belongs to the technical field of coal mine safety and comprises the followingsteps of: acquiring gas monitoring minute mean value data of a jth shift; calculating the mean value of the jth shift gas monitoring number; calculating a k-minute moving mean value of the gas monitoring data in the ith minute; calculating an m-minute moving mean value of the gas monitoring data in the ith minute; calculating the maximum value of the k-minute moving mean value in the jth shift; calculating the maximum value of the moving mean value of m minutes in the jth shift; calculating the maximum gas desorption amount of k minutes in the jth shift; calculating the maximum gas desorptionamount in m minutes in the jth shift; calculating the ratio of the gas desorption amount of k minutes or m minutes in the jth shift to the total gas emission amount of the jth shift; calculating theratio of the gas desorption amount of k minutes to the gas desorption amount of m minutes in the jth shift; calculating the ratio of the maximum value of the k-minute moving mean value to the maximumvalue of the m-minute moving mean value in the jth shift; final recognition.
Owner:CHINA COAL TECH ENG GRP CHONGQING RES INST

Method for detecting semiconductor device electrical property failure

The invention discloses a method for detecting a semiconductor device electrical property failure. The method for detecting the semiconductor device electrical property failure comprises the following steps of: S1, collecting the gray scale: a. taking the minimum region which can be scanned by an electron beam defect scanner as a scanning unit region, setting as a defect through a program form and detecting the defect, and shooting an electron microscope atlas; and b. taking a semiconductor device as a scanning object, scanning under different conditions, and analyzing the gray scale; S2, screening scanning conditions, and testing the electrical property of the scanning conditions; acquiring a similarity numerical value; and defining the optimal scanning condition; S3, carrying out fixed point gray scale analysis so as to obtain a gray scale data collecting interval with an effective electrical property; and S4, forecasting an electrical property failure region. According to the invention, the gray scale collected data obtained by the electron beam defect scanner and the electrical property testing data are compared, the electrical property failure region and an electrical property effective region can be forecast effectively, which provides a basis for monitoring the advantages and disadvantages of an ion implantation technology, provides a technical support for to-be-adopted improving measures, and provides a powerful guarantee for shortening the research cycle of the semiconductor device.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Industry economy evaluation method based on multi-dimensional power utilization panel data

The invention discloses an industry economy evaluation method based on multi-dimensional power utilization panel data. The industry economy evaluation method comprises the following steps: 1, inputting a time sequence; 2, verifying whether a time relationship exists between the economic condition of the region and the total power consumption or not based on the stability of the unit root; 3, if the result is stable, analyzing data through regression analysis, causal analysis and association analysis; 4, if the result is not stable, indicating that the input data is related to time, and carrying out differential processing on the data; 5, performing co-integration inspection; 6, obtaining a long-term relation between economy and electricity consumption through analysis in the step 5, and modeling the relation to obtain a long-term 'balance' relation model between economy and electricity consumption; 7, performing an error correction model; 8, if the difference result in the step 4 is not stable, indicating that the data is irregular and cannot be analyzed; 9, ending the evaluation analysis, and generating an evaluation analysis result report. The technical problem that the prior artis not suitable for analyzing industries, industries and other specific economic levels is solved.
Owner:GUIZHOU POWER GRID CO LTD

Energy load hybrid prediction method and device, computer equipment and storage medium

PendingCN114580771AEffective forecastHelps to properly configureForecastingResourcesLoad forecastingSimulation
The invention relates to an energy load hybrid prediction method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: constructing an independent load prediction model corresponding to each energy type; inputting the actual load data corresponding to each energy type of the N historical days into an independent load prediction model corresponding to each energy type to obtain a predicted load coupling result corresponding to each energy type of the to-be-predicted day; determining model variable information corresponding to each energy type; for each energy type, constructing a hybrid load prediction model corresponding to the energy type according to the model endogenous variable and the model exogenous variable; and inputting the actual load data corresponding to each energy type of the N historical days into the mixed load prediction model corresponding to each energy type to obtain mixed prediction load data corresponding to each energy type of the to-be-predicted day. By adopting the method, effective estimation of medium-and-long-term load conditions is realized, and reasonable configuration of energy storage links in an energy supply system can be facilitated.
Owner:CHINA SOUTHERN POWER GRID DIGITAL GRID RES INST CO LTD

Method for Predicting Earthquake Location and Range by Geometric Diagram Method of Groundwater Temperature Warning Points

The invention, which belongs to the earthquake prediction field, provides a geometric-graphic-method-based method for predicting an earthquake position and range with underwater temperature alarm points. The method comprises: many underwater temperature monitoring points (1) are marked on a corresponding regional map to form a network distribution graph (2) for earthquake prediction; when an earthquake will occur at a certain place, all alarm points (3) are marked correspondingly on the distribution graph, four low-temperature alarm points (4 and 5) and high-temperature alarm points (6 and 7) in different directions are selected, straight lines (8 and 9) in intersection and extending lines (10 and 11) are drawn on the four alarm points on the distribution graph (2); straight line centering points (23 and 35) of all straight lines are searched by using geometric graphic methods of an isosceles triangle and the like, so that prediction information of a central zone (45) position, a seismic wave, and a range (46) of an incoming earthquake can be obtained. Therefore, a prediction and prevention effect for an earthquake is realized; and thus losses caused by the earthquake disaster for human beings can be maximized.
Owner:徐州天骋智能科技有限公司

Method for detecting repetitive defects of semiconductor devices

A semiconductor device repeated defect detection method comprises a step S1: fixed point scanning, namely a fixed point scanning form is established, an internal zone of a repeated unit of a to-be-detected module is selected, a minimum zone which an electron beam defect scanner can scan is used as a scanning unit zone which is set to be a defect to be detected, and an electron microscope map is photographed; a step S2: gray scale sample collecting, namely the electron microscope map obtained in step S1 is analyzed in a gray scale mode, typical gray scale distribution and a gray scale distribution interval of the typical gray scale distribution are acquired, and a standard gray scale interval is defined; and a step S3: abnormal semiconductor device forecasting. Gray scale collecting data obtained through the electron beam defect scanner is compared with the standard gray scale interval of a normal semiconductor device, an abnormal semiconductor device can be forecast effectively, effective monitoring on a repeated defect generated in ion implantation technology is achieved, and accordingly a methodology is provided for process window optimizing and on-line monitoring, and on-line manufacturing of semiconductors and yield improvement are guaranteed.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP
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