6results about How to "Efficient scanning" patented technology

The utility model provides a foreign matter detection device on a konjaku flour assembly line, which comprises a first conveying mechanism, two parallel second conveying mechanisms which operate independently are arranged below the end part of the first conveying mechanism, and X-ray detection devices are arranged on the second conveying mechanisms; a partition plate is arranged between the two second conveying mechanisms, a rotating flow guide plate is arranged on the partition plate, and the flow guide plate rotates on the first conveying mechanism and is used for distributing materials on the first conveying mechanism; and a paving device is arranged between the partition plate and the second conveying mechanism, is arranged at the front end of the X-ray detection device and is used for flattening materials on the second conveying mechanism. The foreign matter detection problem caused by random stacking of materials is effectively solved, the detection efficiency and the product quality can be improved on the premise that normal production is not affected, and the safety and the stability of the production process are greatly improved.

This utility model relates to the field of testing equipment technology, and in particular to a glass substrate testing device, including a frame, a support platform mounted on the frame and provided with a positioning surface for fixing the surface of the material to be tested, a testing camera assembly mounted above the support platform, the testing camera assembly being movable relative to the support platform, and the lens of the testing camera assembly reciprocating on the positioning surface, a positioning and locking mechanism being mounted at the edge of the positioning surface and assembled to position at least one side of the surface of the material to be tested, and an elastic pressing positioning unit connected to the testing camera assembly, capable of pressing the upper surface of the material to be tested so that the upper surface of the material to be tested is perpendicular to the lens direction of the testing camera assembly. This device can improve testing accuracy and efficiency, and can accurately acquire internal morphological information of micropores, as well as measure key parameters of micropores.

This invention discloses a wafer surface inspection control method, apparatus, system, and storage medium thereof. The method includes controlling an optical scanning device to scan the wafer twice, according to a first preset scanning path and a second preset scanning path, while a clamping mechanism is clamping the wafer to be inspected at a designated position. During the two scans, the clamping mechanism is controlled to perform an avoidance action, obtaining a first front image, a first back image, a second front image, and a second back image, respectively. The first and second front images are then stitched together, as are the first and second back images, to generate a complete front image and a complete back image, respectively. This invention achieves automatic wafer surface inspection, improves the automation level of wafer surface inspection, and solves the problems of existing technologies that cannot avoid clamping interference and cannot efficiently obtain complete front and back images of the wafer.

The application discloses a kind of negative pressure three-axis automatic movement nondestructive testing device, including control system, XY moving assembly and scanning component.XY moving assembly contains X axis, Y axis and power component, X axis and Y axis are all by guiding guide rail and its two ends suction assembly constitute, suction assembly has the Z axis movement function of control vacuum chuck contact or separate from detection plane.Control system controls the suction assembly of X axis and Y axis to be alternately adsorbed in detection plane and keep still, while driving the shaft not adsorbed together or relative to power component moves, to realize the two-dimensional self-adapting step of device on detection plane.Scanning component carries probe and executes scanning along with device movement.The application further discloses a kind of negative pressure three-axis automatic movement nondestructive testing method.The application does not need external track, avoids workpiece surface damage by non-sliding step mode, and negative pressure adsorption makes it compatible with non-magnetic material, realizes to large plate high efficiency, high precision, full-automatic nondestructive testing.

The invention discloses a variable light spot LED lens module adopting a cam push rod mechanism, and relates to the technical field of lighting equipment, the variable light spot LED lens module comprises a shell, a lighting mechanism is arranged on the rear side in the shell, and a light changing mechanism is arranged on the front side in the shell; the light changing mechanism comprises a movable plate slidably connected to the interior of the shell, a movable block slidably connected to the interior of the movable plate, a movable seat rotatably connected to the interior of the movable block, a first lens fixedly arranged above the movable seat, a fixed plate fixedly arranged in the shell, a guide groove formed in the fixed plate, and two channels obliquely extending towards the two sides in a symmetrical structure from the rear portion of the guide groove. The moving seat is in sliding fit with the interior of the guide groove; the front side of the bottom face of the inner side of the shell is rotationally connected with a rotating disc, a plurality of limiting rods which are annularly arranged at equal intervals are fixedly arranged on the rotating disc, and rod grooves in sliding fit with the limiting rods are formed in the two side walls of the front portion of the guide groove. According to the invention, the dark space range at the edge of the lighting equipment during fan-shaped scanning can be effectively reduced, and the lighting quality is greatly improved.

The invention provides a sole contour scanning system based on a point laser sensor, which relates to the technical field of shoemaking and comprises a conveying mechanism, the point laser sensor and a control unit. The control unit is used for executing the following steps that real-time height difference data are collected and judged based on the point laser sensor at the initial position; when it is judged that the height difference data is larger than the first set value, the control point laser sensor reciprocates in the second direction; in the reciprocating motion process of the point laser sensor, when it is judged that the height difference is larger than a second set value, the point laser sensor continues to move by a set movement distance and then moves reversely; after it is detected that the height difference data is kept stable and unchanged, the point laser returns to the initial position; and judging the height difference data, screening effective data and outputting the effective data. Efficient scanning and data processing are achieved, motion blur is effectively reduced, effective data are screened, and the detection precision and stability are improved.