The invention provides an IGBT device with an integrated
voltage sampling function, and belongs to the technical field of power
semiconductor devices. A channel in which a
JFET structure is introducedin a
body region is in a normally-
closed state, the device is in a forward turning-on state, and carriers are stored in the
body region, so that an
electric conductance modulating action is strengthened, and the saturated turning-on
voltage drop of the device is reduced; in a turning-off state of the device, the
body region plays a floating field limiting ring role, so that an
electric field aggregation phenomena at the bottom of a groove gate is weakened, and the
voltage withstand reliability of the device is improved; the grid
electrode and the source
electrode of the introduced
JFET structure are connected with a
peripheral control circuit and a sampling port respectively, a voltage sampling function can be realized by using a mapping reaction between the voltage change of the source
electrode of the
JFET structure and withstanding voltage of an IGBT, and the forward blocking characteristic of the device cannot be damaged while an electric
isolation effect is reached; and the adjustment for voltage sampling rate is realized by changing the grid electrode bias voltage of the JFET structure, so that the requirement of different application conditions on voltage sampling is met. The IGBT device is simple in sampling structure, and is compatible with an existing technology.