The application discloses a kind of methods for realizing redundant function
memory chip test, it is related to
memory chip test technical field, including, based on
hypergraph fault model calculation hyperedge
coupling strength, according to hyperedge
coupling strength using weighted flip mode generates
test vector sequence and storage unit test instruction;
Test vector sequence is injected into the
memory chip to be measured, and storage unit test instruction is executed piece by piece, while capturing failure
cell coordinates and failure mode category;Based on failure
cell coordinates and failure mode category, Hall triplet is constructed, and theorem prover is used to execute theorem proof to Hall triplet to verify test completeness, when
verification fails, generate incremental
test vector, and re-execute theorem proof,
record the result of test completeness;The application establishes
hypergraph fault model, improves the coverage of non-independent failure, reduces the number of redundant test instructions, reduces test time and
resource consumption, improves defect detection efficiency.