The application provides an IGBT hard switching loss
current sensor-free measurement method suitable for an INPC topology, a commutation process of an IGBT in the INPC topology is analyzed systematically from the physical mechanism of a hard switching process of a power device, and the switching characteristics of the IGBT are mainly studied. On this basis, the mapping relationship between the
voltage waveform characteristics and the current change and the switching loss is determined, and a corresponding hard switching loss analytical model is established. The model established in the application only depends on the parameters of the device data book and the measured collector-emitter
voltage data, does not need to introduce a
current sensor or an additional
test structure in the main power loop, and can realize effective evaluation of the IGBT hard switching loss in the INPC topology. The measurement method has lower requirements for test conditions and has good
engineering applicability, and the accuracy is verified by
simulation results.