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238 results about "Device aspects" patented technology

Thin-film transistor, method of producing thin-film transistor, electronic circuit, display, and electronic device

InactiveUS20050029514A1Easy and highly reliable mannerReduce the driving voltageTransistorSolid-state devicesDisplay deviceEngineering
Aspects of the invention can provide a thin-film transistor having good transistor characteristics and operable with a low driving voltage, a method of producing such a thin-film transistor, a high-reliability electronic circuit, a display, and an electronic device. In an exemplary thin-film transistor according to the invention, a gate electrode can be formed on a substrate via an underlying layer, and a gate insulating layer can be formed on the substrate such that the gate electrode is covered with the gate insulating layer. A source electrode and a drain electrode are formed on the gate insulating layer such that they are separated from each other by a gap formed just above the gate electrode. An organic semiconductor layer can be formed thereon such that the electrodes are covered with the organic semiconductor layer. A region between the electrodes of the organic semiconductor layer functions as a channel region. A protective layer can be arranged on the organic semiconductor layer. This thin-film transistor is characterized in that the organic semiconductor layer is formed after the gate insulating layer is formed, and the gate insulating layer has the capability of causing the organic semiconductor layer to be aligned.
Owner:SEIKO EPSON CORP

Thin-film transistor, method of producing thin-film transistor, electronic circuit, display, and electronic device

Aspects of the invention can provide a thin-film transistor having good transistor characteristics and operable with a low driving voltage, a method of producing such a thin-film transistor, a high-reliability electronic circuit, a display, and an electronic device. In an exemplary thin-film transistor according to the invention, a gate electrode can be formed on a substrate via an underlying layer, and a gate insulating layer can be formed on the substrate such that the gate electrode is covered with the gate insulating layer. A source electrode and a drain electrode are formed on the gate insulating layer such that they are separated from each other by a gap formed just above the gate electrode. An organic semiconductor layer can be formed thereon such that the electrodes are covered with the organic semiconductor layer. A region between the electrodes of the organic semiconductor layer functions as a channel region. A protective layer can be arranged on the organic semiconductor layer. This thin-film transistor is characterized in that the organic semiconductor layer is formed after the gate insulating layer is formed, and the gate insulating layer has the capability of causing the organic semiconductor layer to be aligned.
Owner:SEIKO EPSON CORP

Method and system for track traffic failure recognition based on improved Bayesian algorithm

The invention discloses a method and a system for track traffic failure recognition based on improved Bayesian algorithm. The method comprises the following steps of: 1) determining various failure modes and corresponding monitoring values of each traffic device according to circuit structure of the traffic device, and building a failure model aiming at each failure mode and corresponding monitoring value; 2) recognizing a parent child relation among the monitoring data according to the failure model, thus obtaining a standard failure sample data; 3) training with the standard failure sample data through a Bayesian algorithm to obtain a failure recognition model, wherein weight of a parent node in the failure recognition model of each failure mode is greater than that of a child node; 4) monitoring and acquiring various monitoring values of the traffic device in real time, and recording time sequence of the monitoring values; 5) recognizing data through the failure recognition model, and determining corresponding failure. By the method and the system, accuracy of failure recognition is improved, failure repair time is reduced, the device can perform failure self-diagnosis, and traffic safety is guaranteed in the operation and maintenance aspect and the device aspect.
Owner:BEIJING TAILEDE INFORMATION TECH
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