80 results about "Scan circuits" patented technology

The invention discloses a circuit board testing and quality screening automation method and system, and aims to solve the problems of low efficiency, insufficient precision and imperfect quality control of traditional circuit board testing. Precise positioning of the circuit board is achieved through the high-precision X / Y / Z three-dimensional positioning mechanical arm, parallel testing is conducted in combination with equipment such as a multi-channel oscilloscope, a signal source and a spectrum analyzer, and the testing efficiency is improved. Temperature and humidity control testing is carried out through the environment simulation bin, the thermal imager scans temperature distribution of the circuit board, a high-precision instrument is used for detecting signal integrity and analyzing electromagnetic compatibility, and the performance of the high-speed circuit board is ensured. A machine learning algorithm predicts potential faults, a test process is optimized, an automatic sorting system is adopted to separate qualified and unqualified circuit boards, and high consistency and high reliability of product quality are ensured. Through the automatic and intelligent testing process, the production efficiency, the quality control capability and the testing precision are greatly improved, and the labor cost and the production risk are reduced.

The present disclosure provides a scanning device and a scanning method of a touch screen, and relates to the field of display. The scanning device comprises an odd scanning circuit, an even scanning circuit and a touch position determination circuit. The odd scanning circuit comprises a plurality of odd scanning channels formed by a plurality of receiving electrodes in a manner of adjacent two-by-two groups. The odd scanning circuit obtains the sum of sensing signals from two receiving electrodes in the odd scanning channel as an odd scanning signal from the odd scanning channel. The even scanning circuit comprises a plurality of even scanning channels formed by a plurality of receiving electrodes in a manner of adjacent two-by-two groups. The even scanning circuit obtains the sum of sensing signals from two receiving electrodes in the even scanning channel as an even scanning signal from the even scanning channel. The touch position determination circuit determines a touch detection result based on a plurality of odd scanning signals obtained from a plurality of odd scanning channels and a plurality of even scanning signals obtained from a plurality of even scanning channels, so as to improve the accuracy of the touch detection result.

A scan circuit includes a plurality of stages. A respective stage of the scan circuit includes a second processing subcircuit, which includes a first capacitor, a sixth transistor, and a seventh transistor; and a first connecting line connecting a gate electrode of the seventh transistor to a second clock signal line; and a sixth connecting line connecting a first electrode of the seventh transistor, a second electrode of the sixth transistor, and a second capacitor electrode of the first capacitor together. The sixth connecting line crosses over both a first capacitor electrode and the second capacitor electrode of the first capacitor. An orthographic projection of the first connecting line on a base substrate at least partially overlaps with an orthographic projection of the sixth connecting line on the base substrate.

A scan circuit applicable to driving a plurality of light-emitting-diodes of a plurality of scan lines of a display panel is provided. A plurality of switching components are configured, having each switching component connected with one of the scan lines. A plurality of power transistors are disposed corresponding to the scan lines, having each power transistor connected between one scan line and a ground terminal. A low-dropout regulator circuit or a global operational amplifier is alternatively connected to the plurality of switching components in common for selectively generating an output voltage to at least one of the scan lines and avoiding ghost imaging on the display panel. By employing the proposed scan circuit, the invention is effective in achieving de-ghost functioning and avoiding conventional signal coupling issues on the display panel. In addition, redundant power waste consumption can be significantly reduced at the same time.

A scanning display with short-circuit detection function and a scanning device thereof, comprising: a display device including a common-cathode light-emitting diode array and including multiple scan lines and multiple data lines; and a scanning device including multiple scanning circuits. Each scanning circuit includes a voltage generator and a detector. The voltage generator has an output terminal electrically connected to a corresponding scan line and is controlled to generate one of a reference voltage and a clamping voltage to the corresponding scan line. The detector detects the voltage at the output terminal of the voltage generator and generates a detection result indicating whether the corresponding scan line is abnormal based on the voltage at the output terminal and a detection timing signal.

A scanning circuit having multiple stages is provided. Each stage of the scanning circuit includes a respective scanning unit configured to provide a control signal to at least one row of sub-pixels. Each scanning unit includes an input sub-circuit configured to receive a start signal or an output signal from a previous scanning unit, a first processing sub-circuit, a second processing sub-circuit, and an output sub-circuit. The output sub-circuit includes a first output transistor. The input sub-circuit includes a first input transistor and a second input transistor coupled in series between an input terminal and a first node. The first node is coupled to a gate of the first output transistor. The first processing sub-circuit includes a first switch transistor and a second switch transistor coupled between the first node and a first reference terminal. The first reference terminal is configured to receive a first reference signal.

Discussed is a driving module including a PCB having a plurality of circuit printed layers, a plurality of driver ICs attached to the PCB to transmit at least one signal, a plurality of scan ICs attached to the PCB in a manner of being located at positions different from those of a plurality of the driver ICs, a driver circuit connecting a first driver IC and a second driver IC among a plurality of the driver ICs together in a first direction, a scan circuit connecting a first scan IC and a second scan IC among a plurality of the scan ICs together in the first direction, and a controller controlling at least one of a plurality of the driver ICs, a plurality of the scan ICs, the driver circuit, or the scan circuit.

The application provides a token ring-based spike scanning arbitration circuit, which comprises a spike scanning circuit and a token ring circuit; the spike scanning circuit comprises a first complementing unit, a preprocessing unit composed of a subtraction unit and an inverter INV connected in sequence, and an AND gate AGND and an OR gate OR; and the token ring circuit comprises an edge detection unit, a token unit and a second complementing unit connected in sequence. The token ring circuit can use tokens to fairly distribute priorities among all request signals, the spike scanning circuit scans the request signals, and outputs corresponding response signals according to the priorities of the request signals, so that the speed of the arbitration circuit is improved, the fair arbitration in time and space is realized, and the imaging quality of a dynamic visual sensor is effectively improved.

To prevent a reduction in display quality in a display that writes signals in a plurality of pixels.SOLUTION: A display has: a display area including a plurality of pixels arranged in a matrix, the pixels each including a writing control transistor, a light emission control transistor, and a driving transistor driving a light emitting device; first selection lines connected to the writing control transistors in the pixels arranged in a row direction; second selection lines connected to the light emission control transistors in the pixels arranged in the row direction; a first scan circuit that sequentially scans the plurality of first selection lines; and a second scan circuit that scans the plurality of second selection lines. Image data is divided into a plurality of regions different in resolution, and the plurality of regions are arranged so that at least two or more regions are included in a column direction. The speed of scanning performed by the first scan circuit is different in each of the regions arranged in the column direction. The speed of scanning performed by the second scan circuit is equal to or more than the minimum speed and less than the maximum speed of scanning performed by the first scan circuit.SELECTED DRAWING: Figure 1

A display device includes a display panel and a scan circuit configured to provide control signals to the display panel. A plurality of scan units are grouped into N groups, N being a positive integer greater than 2. Each scan unit group includes one or more scan units. The scan circuit further includes N control units respectively connected to the N scan unit groups, and N selection units connected to the N control units. Each control unit of the N control units is configured to provide a start signal to a respective scan unit group of the N scan unit groups. Each selection unit of the N selection units is configured to transmit one or more selection signals to a respective control unit.

A scan circuit includes a plurality of stages. A respective stage of the scan circuit includes a second processing subcircuit, which includes a first capacitor, a sixth transistor, and a seventh transistor; and an input subcircuit including a first transistor, and an input signal line configured to provide an input signal to the first transistor. The respective stage of the scan circuit further includes a sixth connecting line connecting a first electrode of the seventh transistor, a second electrode of the sixth transistor, and a second capacitor electrode of the first capacitor together. The sixth connecting line crosses over both the first capacitor electrode and the second capacitor electrode of the first capacitor. A shortest distance between an active layer of the seventh transistor and the input signal line is less than a shortest distance between an active layer of the sixth transistor and the input signal line.

Embodiments of the present disclosure relate to scan circuits and methods. In one embodiment, a method of performing a scan includes entering a scan mode; receiving a test pattern; applying the test pattern through a first scan chain by asserting and de-asserting a scan enable signal to perform a shift and a capture operation, respectively, on the first scan chain; controlling a further scan flip-flop with the first scan chain while applying the test pattern through the first scan chain without transitioning a further scan enable input of the further scan flip-flop; and evaluating an output of the first scan chain to detect a fault.

A display substrate includes a scan circuit, a first reference signal line in a third region, and at least three clock signal lines arranged in a fourth region. The scan circuit includes a plurality of stages, wherein a respective stage of the scan circuit includes a respective scan unit configured to provide a control signal to at least a row of subpixels. The respective scan unit includes an input subcircuit configured to receive from an input terminal a start signal or an output signal from a previous scan unit of a previous stage, a first processing subcircuit, a second processing subcircuit, and an output subcircuit configured to output an output signal from an output terminal. The output subcircuit includes a first output transistor. The input subcircuit includes a first input transistor and a second input transistor sequentially coupled between an input terminal and a first node.

To provide a photoelectric conversion device capable of reducing the influence of noise caused by a global electronic shutter operation.SOLUTION: A solid-state imaging device includes a pixel array in which a plurality of pixels are arranged in a plurality of rows and a plurality of columns, and a scanning circuit that performs scanning for sequentially selecting a row from the plurality of rows in which the pixels output signals, wherein a first pixel arranged in a first region of the pixel array outputs a signal based on incident light, and a second pixel arranged in a second region of the pixel array does not output a signal based on incident light. A reset operation starts or ends in a period in which pixels in one row of the pixel array output signals, and the number of times of the reset operation performed in the second pixel is larger than the number of times of the reset operation performed in the first pixel in a period from the start of one scanning to the start of the next scanning.SELECTED DRAWING: Figure 6

An array substrate having a display area and a peripheral area is provided. The array substrate comprises a plurality of pixel driving circuits located in a display area; the grid signal driving circuit is positioned in the peripheral area; a source integrated circuit located in the peripheral area; and a scanning circuit located in the peripheral area. Each of the plurality of pixel driving circuits includes a second transistor and a ninth transistor coupled between the first node and the third node. A gate of the ninth transistor is coupled to a third gate line. A gate of the second transistor is coupled to a second gate line. The orthographic projection of the second grid line on the substrate is at least partially overlapped with the orthographic projection of the third grid line on the substrate.

A scan circuit is provided. The scan circuit includes a plurality of scan units cascaded. A respective scan unit of the plurality of scan units includes a first subcircuit connected to a first node; a second subcircuit connected to the first node and a second node; a third subcircuit connected to the second node and a third node; a fourth subcircuit connected to a fourth node and a sixth node; and a fifth subcircuit configured to output an output signal through an output terminal, and is connected to the fourth node. The first subcircuit includes an input transistor, a thirteenth transistor, and a fourteenth transistor. A gate electrode of the thirteenth transistor is configured to receive a third clock signal from a third clock terminal. A first electrode of the thirteenth transistor is configured to receive an input signal from an input terminal.

The invention relates to the technical field of chip testing, in particular to a chip scanning circuit, which comprises a scanning mode selection signal, P first scanning units {q1, q2,..., qp,..., qP}, S second scanning units {r1, r2,..., rs,..., rS}, a second interface, a third interface, a fourth interface, a fifth interface, a first selector and a second selector, the first selector comprises a first enabling end, a first selection input port, a second selection input port and a first selection output port, and the second selector comprises a second enabling end, a third selection input port, a fourth selection input port and a second selection output port. Therefore, the connection mode of the scanning chain can be correspondingly switched by switching the level of the scanning mode selection signal, so that a full scanning mode and a compression scanning mode are adapted, the flexibility of a scanning test is greatly improved, and complex test requirements can be met.

The utility model discloses a key scanning circuit, which can respond to all pressing operations of a key module through an Lth scanning signal output by a signal acquisition and processing module, and also outputs an Mth scanning signal to detect a Kth key signal in the key module again. The detection scanning frequency of part of the keys in the key module is improved, and the detection scanning frequency of the Kth key signal is improved on the premise that the detection scanning frequency of the whole keys is not changed, so that the implementation cost is reduced.

The amount of data sent in a unit time is reduced in a case of transmitting sensor data by using a transmission system involving band limitation.A detection circuit includes a plurality of detection elements, a plurality of scanning lines connected to a scan circuit, a plurality of signal lines connected to a detection circuit, and a control circuit. Each of the plurality of detection elements is connected to the corresponding scanning line and the corresponding signal line. The detection circuit is configured to sequentially read out detection values of signals of the plurality of detection elements through the plurality of signal lines. When a detection value of a signal of a detection element of interest is externally output, the control circuit outputs, as transmission difference data, difference data between a value based on a detection value of a signal of a detection element read out before the detection timing of the detection value of the signal of the detection element of interest and the detection value of the signal of the detection element of interest.

The invention provides a scanning device and a scanning method of a touch screen, and relates to the field of display, the scanning device comprises an odd scanning circuit, an even scanning circuit and a touch position determining circuit; the odd scanning circuit comprises a plurality of odd scanning channels which are sequentially formed by a plurality of receiving electrodes in a mode that every two adjacent receiving electrodes form a group, and the odd scanning circuit takes the sum of induction signals acquired from the two receiving electrodes in the odd scanning channels as an odd scanning signal acquired from the odd scanning channels; the even scanning circuit comprises a plurality of even scanning channels which are sequentially formed by a plurality of receiving electrodes in a mode that every two adjacent receiving electrodes form one group; the even scanning circuit takes the sum of the induction signals acquired from the two receiving electrodes in the even scanning channel as an even scanning signal acquired from the even scanning channel; the touch position determination circuit determines a touch detection result based on a plurality of odd scanning signals obtained from a plurality of odd scanning channels and a plurality of even scanning signals obtained from a plurality of even scanning channels, so as to improve the accuracy of the touch detection result.

The present invention improves the precision of edge detection in an image sensor for detecting the presence or absence of an edge in each pixel pair.　This image sensor comprises: a vertical scanning circuit; and an edge detection circuit. In the image sensor, the vertical scanning circuit outputs pixel signals by sequentially driving first and second pixel pairs, and third and fourth pixel pairs that have an inter-pixel distance different from that of the first and second pixel pairs. The edge detection circuit detects the presence or absence of an edge on the basis of pixel signals of the first, second, third, and fourth pixel pairs.

In a solid state imaging element in which signal processing is performed on a pair of pixel signals, the circuit scale thereof is reduced. The solid state imaging element includes a pixel array section, a vertical scanning circuit, and a signal processing circuit. A plurality of pixels are arranged in directions of rows and directions of columns on the pixel array section. The vertical scanning circuit selects, from among the plurality of pixels, a pair of pixels disposed on both ends of a predetermined line segment, which does not match any of the rows and columns and forms an angle of not 45 degrees with respect to the rows, and causes the selected pixels to simultaneously output of a pair of pixel signals. The signal processing circuit performs predetermined signal processing on the pair of pixel signals.

A scan circuit is provided. The scan circuit includes a plurality of scan units cascaded. A respective scan unit of the plurality of scan units includes an input subcircuit configured to control a voltage level at a pull up node; and at least three output subcircuits including a first output subcircuit, a second output subcircuit, and a third output subcircuit. The first output subcircuit, the second output subcircuit, and the third output subcircuit are coupled to the pull up node. The first output subcircuit, the second output subcircuit, and the third output subcircuit are configured to receive clock signals from a first clock signal line, a second clock signal line, and a third clock signal line, respectively. The first output subcircuit, the second output subcircuit, and the third output subcircuit are coupled to a first output terminal, a second output terminal, and a third output terminal, respectively.

The invention discloses a bendable flexible touch sensor electronic skin, a preparation method and a mechanical arm, belongs to the technical field of flexible electronics, and aims to solve the problem of initial signal drift caused by pre-contact of a sensing layer when an existing film type electronic skin is bent and attached to a curved surface. An insulation structure wrapping an electrode is manufactured on the FPC electrode through a silica gel mold, a conductive area is formed in a strip-shaped gap of the silica gel mold through a dispensing process, and the height of the conductive area is controlled to be slightly smaller than that of a silica gel layer. By means of the design, the upper electrode and the lower electrode keep a physical isolation state without external force, contact is avoided even if the electrode is bent, and therefore initial signals caused by bending are fundamentally eliminated. When and only when definite tactile pressure is applied, the upper and lower conductive areas are contacted to generate a resistance signal which can be detected by the row and column scanning circuit. The method has high-density sensing unit distribution, can effectively detect plane force distribution, and is especially suitable for curved surface application scenes of high-precision tactile perception.

The present invention improves robustness with respect to an imaging environment in an image sensor that detects and processes an edge.　A vertical scanning circuit according to the present invention performs: control for driving, in a first exposure mode, a pixel array unit in which a plurality of pixels are arranged, and outputting a pair of pixel signals as a pair of first pixel signals; and control for driving the pixel array unit in a second exposure mode and outputting a pair of pixel signals as a pair of second pixel signals. An edge determination circuit performs a process for determining whether an edge is present on the basis of the pair of first pixel signals, and a process for determining whether an edge is present on the basis of the pair of second pixel signals. A synthesis unit synthesizes signals from the edge determination circuit.

The utility model discloses a drive scanning circuit and a display device. The drive scanning circuit comprises a first scanning control unit, a second scanning control unit, a pull-down unit and a drive output unit. The first ends of the first scanning control unit, the second scanning control unit, the driving output unit and the pull-down unit are connected to a common connection point, and the second end of the pull-down unit is electrically connected with the driving output unit; the first scanning control unit is turned on by a first pulse in a scanning period, the second scanning control unit is turned on by a second pulse in the scanning period, and the first pulse and the second pulse are multiplied by a pulse width of a specified multiple. The first scanning control unit is started by the first pulse and the second scanning control unit is started by the second pulse in the scanning period, so that the condition that the first level input end or the third level input end continuously inputs forward bias voltage to the transistor in a forward scanning stage or a reverse scanning stage is avoided, and the problem that the characteristic drift of the transistor is caused in the prior art is solved. And the display quality is reduced.

A scanning circuit is provided, comprising a first control signal driving circuit, a second control signal driving circuit and a third control signal driving circuit; wherein in a first region, the first control signal driving circuit comprises L levels, L being an integer greater than or equal to 1; in a second region, the second control signal driving circuit comprises M1 levels, and the third control signal driving circuit comprises M2 levels, M1 and M2 being integers greater than or equal to 1; in a third region, the first control signal driving circuit comprises N1 levels, the second control signal driving circuit comprises N2 levels, and the third control signal driving circuit comprises N3 levels, N1, N2 and N3 being integers greater than or equal to 2; and the first region, the second region and the third region respectively surround a first part, a second part and a third part of a periphery of a display region, the first part, the second part and the third part at least partially not overlapping.

The present application belongs to the technical field of power transmission and transformation equipment, and specifically relates to a combined cable power transmission and transformation equipment with image processing, which comprises a temperature detection module, a coordinate module, a threshold comparison module, a region identification module, a position searching module, a calibration module and a control module. The temperature detection module is used for scanning the surface temperature of the circuit equipment and generating a temperature distribution image. The coordinate module is used for establishing the correlation between the temperature distribution image and the circuit equipment. The threshold comparison module is used for setting the temperature threshold of the circuit equipment, comparing the temperature of the temperature distribution image with the temperature threshold, and then marking the points exceeding the temperature threshold as temperature abnormal points. The control module of the device adjusts the current passing through the abnormal temperature region in the circuit equipment according to the current adjustment value, reduces the heat generated by the temperature abnormal region, and makes the abnormal temperature on the cable power transmission and transformation equipment return to the normal interval. Further, the frequency of alarms and the frequency of manual maintenance are reduced.

A scanning display with short-circuit detection function and a scanning device thereof, comprising: a display device including a common anode structure light emitting diode array and including a plurality of scanning lines and a plurality of data lines; and a scanning device including a plurality of scanning circuits, each of the scanning circuits including a voltage generator and a detector, the voltage generator having an output end electrically connected to a corresponding scanning line of the scanning lines and controlled to generate one of an input voltage and a clamping voltage to the corresponding scanning line, and the detector detecting a voltage of the output end of the voltage generator and generating a detection result indicating whether the corresponding scanning line is abnormal according to the voltage of the output end and a detection timing signal.

A display apparatus includes a display panel(DP), and a scan circuit(SC) configured to provide control signals to the display panel(DP). The plurality of scan units(SU) are grouped into N number of groups, N being a positive integer greater than 2. A respective group of scan units(SU) includes one or more scan units(SU). The scan circuit(SC) further includes N number of control units(CU) connected to the N number of groups of scan units(SU), and N number of selection units(SLU) connected to the N number of control units(CU), respectively. A respective control unit(CU) of the N number of control units(CU) is configured to provide a start signal to the respective group of scan units(SU) of the N number of groups of scan units(SU). A respective selection unit(SLU) of the N number of selection units(SLU) is configured to transmit one or more selection signals to the respective control unit(CU).