The invention relates to a
chip decoupling capacitor position determination method, device and
system. The method comprises the following steps: establishing a first PCB three-dimensional model according to a to-be-tested
chip and PCB wiring; establishing a second PCB three-dimensional model according to the first PCB three-dimensional model and the
decoupling capacitor, and confirming the position where the
decoupling capacitor is arranged as the current position; acquiring a corresponding second S parameter according to a preset suction current frequency; inputting a preset EMI
radiation excitation signal to the second PCB three-dimensional model, and outputting second EMI
radiation intensity; if the second S parameter and the second EMI
radiation intensity do not meet the preset EMI radiation condition, the decoupling
capacitor is arranged on the PCB wiring between the power supply pin and the current position, the current position is updated to be the position where the decoupling
capacitor is arranged until the preset EMI radiation condition is met, the updated current position is determined to be the optimized position of the decoupling
capacitor, and the optimized position of the decoupling capacitor is determined to be the optimized position of the decoupling capacitor. The optimization of the position of the decoupling capacitor is realized, and the confirmation efficiency of the position of the decoupling capacitor is improved, so that the production efficiency of a
chip circuit is improved.