The invention discloses a
chip sample delayering
grinding method, and belongs to the field of
chip test and analysis. The
chip sample delayering
grinding method is implemented based on a chip sample
grinding device. The chip sample grinding device comprises a base, wherein a supporting frame is arranged on the upper side of the base, a through groove is formed in the position, opposite to a chip groove, of the middle of the top face of the supporting frame, a fixing box is arranged on the right side of the top face of the supporting frame, a threaded hole is formed in the middle of the top face of the fixing box, a
metal hose is connected with the upper end of the threaded hole, a collecting
bottle is arranged in the fixing box, external threads are arranged on the outer wall of the open end of the collecting
bottle, a filter screen is embedded in the middle of the bottom face of the collecting
bottle, and a fixed-point sampling
assembly is arranged below the left side of the
metal hose. In this way, the accuracy of the grinding sampling work of the fault area of the chip is improved, samples in other areas are prevented from being mixed with the sample, the effectiveness of analysis results is improved, and great help is provided for workers to analyze the cause of the fault of the chip.