12results about "Omegatrons" patented technology

A method of carrying out mass spectrometry, comprising: using an electrostatic or electrodynamic ion trap to contain a plurality of ions, each ion having a mass to charge ratio, the ions having a first plurality of mass to charge ratios, each ion following a path within the electrostatic or electrodynamic ion trap having a radius; and for each of a second plurality of the mass to charge ratios: modulating the radii of the ions in a mass to charge ratio-dependent fashion dependent upon the mass to charge ratio; fragmenting the ions thus modulated in a radius-dependent fashion; and determining a mass spectrum of the ions.

The application provides an ion cyclotron resonance device for mass spectrometry, a control method and a mass spectrometer. The device comprises a cylindrical space region for ion introduction, excitation and detection. In the ion excitation process, the ions are excited radially outward from the center of the cylindrical space region. A pair of magnets are arranged axially parallel to the cylindrical space region for generating a magnetic field in the space region. The magnets have opposite polarities. The opposite surfaces of the magnets are perpendicular to the axial direction. The magnetic field intensity of the central region of the space region is greater than that of the outer peripheral region along the radial direction. An electrode array is arranged between the pair of magnets. An alternating voltage is applied to the electrodes of the electrode array for exciting the ions. The ion cyclotron resonance device can solve multiple problems such as device miniaturization, resolution, equipment and manufacturing cost.

The invention comprises a method for separating ions, comprising the steps of: providing an ion cyclotron resonance separator with a longitudinal axis; applying a magnetic field gradient along a length of the longitudinal axis; passing a single fixed radio frequency radially across the longitudinal axis; and spatially separating the ions at mass-to-charge ratio resonance locations along a length of the longitudinal axis, where the magnetic field gradient is within a range of 0 to 0.65 Tesla, where the single fixed radio frequency is maintained in a range of 40 kHz to 20 MHZ, and where the step of spatially separating further comprises the step of spiraling radially outward at a first resonance location a first set of ions, of the ions, the first set of ions comprising a first range of mass-to-charge ratios, the first resonance location comprising a first mass-to-charge ratio resonant with the applied radio frequency.

Apparatus and methods for performing charge detection mass spectrometry for measurement of the mass of a single ion of interest are disclosed. The ion of interest is caused to undergo harmonic oscillatory movement in the trapping field of an electrostatic trap, such that an image current detector generates a time-varying signal representative of the ion's oscillatory movement. This time-varying signal (transient) is processed (e.g., via a Fourier transform) to derive the ion's frequency and consequently determine the ion's mass-to-charge ratio (m / z). Ion charge is determined by construction of a Selective Temporal Overview of Resonant Ion (STORI) plot, which tracks the temporal evolution of signals attributable to the ion of interest, and where the slope of the STORI plot is related to the charge. The STORI plot may also be employed to identify ion decay events during transient acquisition and / or the presence of multiple ions of the same mass or non-resolvable ions.

In one aspect, a method of calibrating a Fourier Transform (FT) multipole mass spectrometer is disclosed, which comprises measuring a plurality of secular frequencies of a calibrant ion in a multipole FT mass analyzer for a plurality of RF voltages (VRF) applied to at least one rod of the multipole mass analyzer, calculating Mathieu β and q parameters for each of 5 the measured secular frequencies, and determining RF voltage amplitude (VRF) for each calculated q parameter. For each calculated q parameter, an offset RF voltage amplitude (ΔVRF) corresponding to a deviation of the applied VRF and the calculated VRF is determined so as to generate a ΔVRF v.s. q calibration curve.

In one aspect, a mass spectrometer is disclosed, which comprises a Fourier Transform (FT) mass analyzer having an input port for receiving ions and an exit port through which the ions exit the FT mass analyzer, a detector disposed downstream of said FT analyzer for detecting ions exiting the FT analyzer, and a multi-segment ion guide having a plurality of segments, said multi-segment ion guide being disposed upstream of said FT mass analyzer and having an input port for receiving ions and an output port through which ions exit the FT mass analyzer. The segments of the ion guide are configured to be independently activated via application of a DC offset voltage thereto so as to adjust a length through which ions passing through the ion guide experience collisional cooling.

The objective of the present invention is to manufacture an acceleration device and a mass analysis device inexpensively and with a compact size, enabling them to be used by any person. The mass analysis device (300) is configured from a plurality of substrates, including a first main substrate (301), a first upper substrate (302) adhered to the upper surface of the first main substrate (301), and a first lower substrate (303) adhered to the lower surface of the first main substrate (301). A mass analysis chamber (308) is a passage formed in the first main substrate (301) and running from the upper surface of the first main substrate (301) to the lower surface of the first main substrate (301), and enclosed in the direction perpendicular to the substrate surfaces (the Z direction) by the upper substrate (302) and the lower substrate (303), enclosed on both sides in the direction (the direction X) which is orthogonal to the Z direction and is the direction of advance of charged particles (318) by first main substrate side plates (301-4, 301-5), and enclosed on both side surfaces in the direction (the Y direction) orthogonal to the Z direction and the X direction by the first main substrate (301). A center hole (310-4) is opened in the first main substrate side plate (301-4) to which the charged particles (318) are incident, and the charged particles (318) enter the mass analysis chamber (308) from the center hole (310-4) formed in the first main substrate side plate (301-4).

There is provided a method of analysing isotopes of an element present in a compound of interest from a mass spectrum obtained by a Fourier transform mass spectrometer. The method comprises generating