A time-controlled intermittent life test method based on junction temperature real-time correction comprises the following steps that a sample is selected for a pre-test, temperature rise time of a junction temperature variable quantity, meeting a test requirement, of a specific device under driving power is determined, and the time when the junction temperature is reduced to an initial temperature is recorded; the temperature rise time measured by the pre-test is used as a temperature rise period of a cycle period, constant driving power is continuously applied in the temperature rise period,after the temperature rise period is finished, narrow pulse excitation is used for measuring an end point junction temperature of the device, and the temperature drop time measured by the pre-test isused as the temperature drop period for cooling the device; and after the temperature drop period is finished, if the junction temperature does not reach the initial temperature, a secondary temperature drop period is continued, wherein the next cycle period is equal to the sum of the time of the temperature drop period and the time of the secondary temperature drop period of the previous cycle period. In the invention, an intermittent working state of a component can be simulated more strictly, and an intermittent life test requirement can be met more accurately.