The utility model provides a sample clamp for a transmission
electron microscope, which comprises a main body seat and a sample body, a first adjusting ring and a second adjusting ring are arranged between the main body seat, and the first adjusting ring and the second adjusting ring are connected with each other; mounting grooves are formed in the two ends of the main body seat, bearings are arranged in the mounting grooves, connecting columns are arranged on one side of the first adjusting ring and one side of the second adjusting ring, and the connecting columns penetrate through the bearings; an adjusting wheel is arranged on one side of the main body seat, the first adjusting ring is sleeved with the adjusting wheel, a fixing
assembly is arranged between the first adjusting ring and the second adjusting ring, and the sample piece body is clamped on the fixing
assembly. According to the sample
wafer clamp, a first adjusting ring and a second adjusting ring are arranged between main body seats and are rotationally connected with the main body seats; the sample sheet body is clamped in the fixing
assembly between the first adjusting ring and the second adjusting ring, so that the sample sheet body rotates along with the adjusting rings, adjustment at different angles can be carried out according to requirements, a required part can be accurately aligned, and the experiment effect and the
data accuracy are effectively improved.