The invention relates to a
management system of a
wafer acceptable test procedure and an application method of the
management system. The
management system of the
wafer acceptable test procedure comprises a reading unit, a storage unit, an inquiry unit and a display unit. The storage unit is provided with product
lot number data of a plurality of batches of products, testing
machine number data, testing procedure name data, probe procedure name data,
probe card type data, procedure grouping name data,
machine property data,
copper / non-
copper wiring data, procedure establishing personnel
job number data and test procedure detailed description data, wherein the testing
machine number data, the testing procedure name data, the probe procedure name data, the
probe card type data, the procedure grouping name data, the machine property data, the
copper / non-
copper wiring data, the procedure establishing personnel
job number data and the test procedure detailed description data correspond to the product lot identification numbers of the various batches of products. The reading unit obtains operational data as required and transmits the operational data to the inquiry unit. The inquiry unit inquires
data information which is stored in the storage unit and corresponds to the operational data and the corresponding
data information is displayed through the display unit. According to the management
system of the
wafer acceptable test procedure and the application method, an operator is enabled to be clear about the fact that the wafer acceptable test procedure is carried out in a corresponding testing machine, testing efficiency is improved, and the factory cost of semiconductors is reduced.