This invention discloses an online testing method for simultaneously measuring multiple MEMS material property parameters. The invention includes the design and application of an online MEMS testing structure. The required testing structure consists of a V-shaped thermal
actuator and two comb-shaped electrostatic actuators at its front and rear ends. Analysis of the behavior of these actuators allows for the calculation of the Young's modulus,
residual stress, and coefficient of
thermal expansion of the
silicon material layer. To achieve this, a
physical model is first established to design the geometric parameters of the two comb-shaped electrostatic actuators and the V-shaped thermal
actuator, ensuring that the actuators are sufficiently sensitive to the properties of the material layer and relatively easy to drive. This invention completes the measurement process by applying electrical excitation, analyzing the electrical
signal feedback, and subsequent
data processing. It does not rely on other complex
testing equipment or harsh testing environments and is applicable to different MEMS processes without requiring additional
processing steps. This has practical significance for improving MEMS testing efficiency and the degree of
automation in the testing process.