The invention relates to the field of
electromagnetic shielding in an
electron microscope room and provides a high-precision combined shielding method for an
electron microscope room. The method comprises the following steps: S1, simulating an
electron microscope operating experimental environment to perform initial
magnetic field measurement, and testing the values of the
direct current and
alternating current magnetic field environments respectively; S2, using a low-
carbon steel plate as a shielding shell, and calculating the thickness of the shielding shell based on the tested
magnetic field environment value and a target value of the magnetic field environment of the
electron microscope equipment; S3, after the shielding shell is welded and the shielding door and the
waveguide window are installed, a shielding test is performed, and weak points and
magnetic leakage points are reinforced, wherein the
waveguide window comprises a magnetic
waveguide tube and a hexagonal
honeycomb vacuum
brazing waveguide window, and the magnetic waveguide tube comprises a shell and a grid; S4, setting an active shielding
system, correcting the deviation of the
electron microscope experimental magnetic field environment in the actual operating stage, being able to simultaneously meet the requirements of magnetic field and
electromagnetic shielding, optimizing the waveguide window structure, and simultaneously meeting the requirements of shielding for low-frequency and high-frequency electromagnetic
waves.