A temperature computing parameter providing circuit, configured to generate sensing voltage values and calibrated voltage values as temperature computing parameters for a target electronic device, including: a parameter computing circuit, configured to compute a reference voltage, which is a cross voltage of a reference resistor coupled to the target electronic device in series, to generate a reference voltage value, and to compute the sensing voltage, which is a cross voltage of the target electronic device, to generate the sensing voltage value; a reference temperature sensing circuit, configured to sense a current reference temperature of the reference resistor; and a computing circuit, configured to calibrate the reference voltage value to generate the calibrated voltage value according to a calibrating function and the current reference temperature. The calibrating function corresponds to a resistance-temperature variation function.