The present invention discloses an absolute pressure
contact type MEMS capacitive thin film vacuum sensor, including a sensor
chip, a housing for mounting the sensor
chip, and an upper shell for encapsulating the sensor
chip in the housing; the sensor chip includes a borosilicate pressure-sensitive film, a
silicon substrate and a glass substrate, which are connected in sequence from top to bottom; a cavity is provided on one side of the
silicon substrate, and the
silicon substrate is directly bonded to the borosilicate pressure-sensitive film on the side provided with the cavity to form a vacuum
reference cavity; an air extraction hole is provided in the vacuum
reference cavity, and the air extraction hole is sealed by anodically bonding the other side of the silicon substrate to the glass substrate, so that the vacuum
reference cavity forms a high vacuum. The present invention simplifies the process flow and reduces the
lower limit of measurement of the vacuum sensor by providing an air extraction hole inside the vacuum reference cavity, converting the technology of forming the vacuum reference cavity into a combination of silicon-silicon
direct bonding and silicon-glass
anode bonding; a protective ring is provided on the borosilicate pressure-sensitive film to reduce the influence of the sensor sensitivity and improve the resolution of the vacuum sensor.