2results about How to "Addressing Test Accuracy" patented technology

The invention discloses a rectification circuit and a displacement measurement method and a displacement measurement system based on the rectification circuit. Wherein the rectifying circuit comprises a first operational amplifier circuit and a second operational amplifier circuit, a first input resistor in the first operational amplifier circuit is connected with an inverted input end of a first operational amplifier, a first feedback resistor is connected with the first operational amplifier in parallel, a first diode is connected with the first operational amplifier in parallel, and a second diode is connected with the first operational amplifier in series; the second operational amplifier circuit is connected with the first operational amplifier circuit in series through a second input resistor, the input end of the second input resistor in the second operational amplifier circuit is connected with the positive electrode of a second diode, the output end of the second input resistor is connected with the inverted input end of a second operational amplifier, and a third input resistor is connected with the inverted input end of the second operational amplifier. The second feedback resistor is connected in parallel with the second operational amplifier. According to the invention, the problem of test precision caused by phase difference in a displacement measurement system based on the differential transformer is successfully solved.

The utility model discloses a photovoltaic cell piece's testing arrangement, including test base, test P pole row, test N pole row, wire exit, flexible conductive layer, cell piece, test upper plate, test P pole row and test N pole row are installed in test base respectively according to polarity, the flexible conductive layer whole piece is laid on test P pole row and test N pole row, the test base four corners are equipped with guide shaft, test upper plate corresponds guide shaft and is equipped with guide shaft sleeve. Adopt the whole surface flexible conductive layer and contact cell piece, do not need to carry out accuracy positioning, regardless of the transformation of figure, the versatility is extremely strong, reduce the overall processing accuracy of equipment, break through the test of no main grid cell piece, reduce the cost of photovoltaic cell piece testing equipment, reduce the maintenance frequency of testing arrangement and improve maintenance convenience, guarantee the reliability of test quality.