5results about How to "Addressing Test Accuracy" patented technology

The invention discloses a protocol detection method and device, electronic equipment and a storage medium. According to the specific scheme, a data processing device communicating based on a target protocol in a target network is determined, the target protocol is a protocol in preset protocols, and the preset protocols comprise one of an IEC 103 protocol, an IEC 104 protocol or an IEC 61850 protocol; acquiring data interaction information between the data processing equipment and equipment communicating with the data processing equipment, and analyzing and processing the data interaction information to obtain key field information corresponding to the data processing equipment; and generating an analog control instruction corresponding to the key field information, and sending the analog control instruction to the data processing equipment, so that the data processing equipment performs an equipment security test based on the analog control instruction. According to the invention, the security detection of the data processing equipment in the multi-protocol environment is realized, and the efficiency and accuracy of the security detection are improved.

The invention discloses a rectification circuit and a displacement measurement method and a displacement measurement system based on the rectification circuit. Wherein the rectifying circuit comprises a first operational amplifier circuit and a second operational amplifier circuit, a first input resistor in the first operational amplifier circuit is connected with an inverted input end of a first operational amplifier, a first feedback resistor is connected with the first operational amplifier in parallel, a first diode is connected with the first operational amplifier in parallel, and a second diode is connected with the first operational amplifier in series; the second operational amplifier circuit is connected with the first operational amplifier circuit in series through a second input resistor, the input end of the second input resistor in the second operational amplifier circuit is connected with the positive electrode of a second diode, the output end of the second input resistor is connected with the inverted input end of a second operational amplifier, and a third input resistor is connected with the inverted input end of the second operational amplifier. The second feedback resistor is connected in parallel with the second operational amplifier. According to the invention, the problem of test precision caused by phase difference in a displacement measurement system based on the differential transformer is successfully solved.

The utility model relates to the technical field of salt mist devices, discloses a salt mist device for testing salt mist corrosion of a fishing net, and solves the problems that a salt mist solution is precipitated in the storage and use processes, so that the salt concentration in the solution is changed, the test result is deviated, and the accuracy of the salt mist test is influenced. A salt mist device for salt mist corrosion fishing net testing comprises a liquid storage barrel, a box cover and a supporting ring, a stirring assembly is arranged in the liquid storage barrel, a mist spraying assembly is arranged at the top end of the supporting ring, a motor drives a connecting rod to rotate, the connecting rod rotates to drive a transverse plate and a mounting ring to rotate, and the transverse plate rotates to continuously stir the bottom end of the liquid storage barrel; the installation ring rotates to drive the fan blades to rotate, the fan blades rotate to generate air flow, the air flow drives the salt mist solution to continuously move in the liquid storage barrel, the contact between the sediment in the solution and other components in the solution is increased, and therefore re-dissolution of part of the sediment is promoted.

The utility model discloses a packaging structure of a light quantum chip. The packaging structure of the light quantum chip comprises a first heat dissipation substrate; the semiconductor cooler is located on the first heat dissipation substrate; the first heat dissipation substrate is located on the semiconductor cooler, the second heat dissipation substrate is located on the semiconductor cooler, the PCB is located on the first heat dissipation substrate, and the second heat dissipation substrate is electrically connected with the PCB; the light quantum chip is located on the semiconductor cooler, the at least two optical fiber arrays are located on the semiconductor cooler and the first heat dissipation substrate, and the light quantum chip is located between the two optical fiber arrays and is in optical coupling connection with the two optical fiber arrays; the PCB comprises an FPC (Flexible Printed Circuit) connector; the FPC connector is welded on the reverse side of the PCB, the FPC connector is in line connection with the front side of the PCB, and the FPC connector is used for providing a driving electric signal for the light quantum chip. According to the utility model, the temperature of the light quantum chip can be conducted out to ensure the stability of the chip; the operation frequency of the technological process is reduced, and the product packaging reliability is improved.

The utility model discloses a photovoltaic cell piece's testing arrangement, including test base, test P pole row, test N pole row, wire exit, flexible conductive layer, cell piece, test upper plate, test P pole row and test N pole row are installed in test base respectively according to polarity, the flexible conductive layer whole piece is laid on test P pole row and test N pole row, the test base four corners are equipped with guide shaft, test upper plate corresponds guide shaft and is equipped with guide shaft sleeve. Adopt the whole surface flexible conductive layer and contact cell piece, do not need to carry out accuracy positioning, regardless of the transformation of figure, the versatility is extremely strong, reduce the overall processing accuracy of equipment, break through the test of no main grid cell piece, reduce the cost of photovoltaic cell piece testing equipment, reduce the maintenance frequency of testing arrangement and improve maintenance convenience, guarantee the reliability of test quality.