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30results about How to "Small intensity" patented technology

High spatial resoulution imaging and modification of structures

In a method of high spatial resolution imaging or modifying a structure, the structure is marked with a substance which is selected from the group of substances which can be transferred from a first state having first optical properties to a second state having second optical properties by means of an optical switch over signal. Then, the second state of the substance is adjusted with the switch over signal except for a spatially limited area. If the substance and the switch over signal are adapted to each other in such a way, that everywhere where the switch over signal exceeds a threshold value essentially the second state of the substance is adjusted, and if the spatial area purposefully omitted by the switch over signal is an intensity minimum of an interference pattern, the spatial area of the structure in which the substance is within the first state becomes smaller than the diffraction limit for the switch over signal.
Owner:MAX PLANCK GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN EV

Method for detecting interference in radar system and radar using the same

A method for a radar for determining a level of interference of return of a radar wave transmitted by the radar from a target object and radio wave transmitted by some other radar, and a radar, in particular a frequency modulated continuous wave (FMCW) radar, that performs the method for determining the level of interference between the radar and some other radar is provided. In the method according to the present invention, after incident radio wave received by the radar is subjected by a frequency analysis to obtain frequency spectrum characteristic of the incident radio wave, one of frequency components of incident radio wave, the one of the frequency components having larger intensity than a predetermined intensity threshold value is not used to calculate a reference value that indicates the level of interference.
Owner:DENSO CORP

LED lamp for homogeneously illuminating hollow bodies

A lighting device (40-40″, 45-45″, 50-50″, 60, 80, 93-93″) is provided for the uniform illumination of curved, uneven, or polyhedral surfaces. The lighting device has a plurality of flat chip-on-board LED modules (1, 11, 11′, 21, 31, 41-41″, 46-46″, 51-51″, 61-61″, 71-71′″, 811-818), which are arranged adjacent to each other at least in pairs. Each chip-on-board LED module (1, 11, 11′, 21, 31, 41-41″, 46-46″, 51-51″, 61-61″, 71-811-818) has a plurality of light-emitting LEDs (4, 4′, 14, 14′, 24, 34, 64, 72). The lighting device (40-40″, 45-45″, 50-50″, 60, 80, 93-93″) is characterized by at least one pair of the adjacent chip-on-board LED modules (1, 11, 11′, 21, 31, 41-41″, 46-46″, 51-51″, 61-61″, 71-71′″, 811-818) being arranged at an angle greater than 0° with respect to the surface normals of the modules.
Owner:HERAEUS NOBLELIGHT GMBH

Xrf system having multiple excitation energy bands in highly aligned package

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
Owner:X-RAY OPTICAL SYSTEM INC

Electrical Conductor for Transporting Electrical Energy and Corresponding Production Method

An electrical conductor for transmission of electrical power, having a total cross-section equal to or above 10 mm2 and comprising a plurality of stranded filamentary members, where at least one of the filamentary members is made from microalloyed copper or microalloyed aluminium having annealing temperatures higher than 250° C., and has the side surface thereof totally coated with a fluorinated polymer. The conductor has a better behavior relative to the skin effect and allows operation at high temperatures. Furthermore, if the electrical conductor is suspended, it has a smaller sag and prevents or reduces the accumulation of ice and / or snow.
Owner:LA FARGA LACAMBRA

Method and Its Apparatus for Inspecting Defects

A defect inspection apparatus is capable of inspecting an extremely small defect present on the top and edge surfaces of a sample such as a semiconductor substrate or a thin film substrate with high sensitivity and at high speed. The defect inspection apparatus has an illumination optical system, a plurality of detection optical units and a signal processor. One or more of the detection optical units receives either light diffracted from an edge portion of the sample or light diffracted from an edge grip holding the sample. The one or more of the detection optical units shields the diffracted light received by the detection optical unit based on a signal obtained by monitoring an intensity of the diffracted light received by the detection optical unit in order to inspect a sample portion located near the edge portion and a sample portion located near the edge grip.
Owner:HITACHI HIGH-TECH CORP

Signal processing apparatus, ultrasonic apparatus, control method for signal processing apparatus, and control method for ultrasonic apparatus

A signal processing apparatus scans a beam of elastic waves into an object to be examined, acquires received waveform data of a plurality of scan lines, and performs signal processing to form a tomographic image of said object to be examined from the received waveform data of the plurality of scan lines. The signal processing apparatus includes a scan line correlation calculation part (009) that calculates a correlation value of received waveform data between a first scan line and a second scan line that has a prescribed correlation with the first scan line, for a plurality of positions on the scan lines, and a correlation change position extraction part (010) that extracts, from among the plurality of positions on said scan lines, a position at which the correlation value becomes a value different from a prescribed value as a position at which a unique region can exist.
Owner:CANON KK

Method and apparatus for performing a magnetic pulse welding operation

InactiveUS6921013B1Small intensityFacilitate subsequent performanceMetal working apparatusTubular articlesInductorEngineering
A pair of metallic components are co-axially aligned prior to full energization of the magnetic pulse welding inductor to provide for improved control of the magnetic pulse welding process. To accomplish this, either or both of the components are supported in a floating manner. An electromagnetic coil is then energized so as to generate a magnetic field of relatively small intensity within or about one of the components. This relatively small intensity magnetic field exerts a relatively small force on the two components, causing them to move to a co-axially aligned position relative to one another and to the coil. Then, while the components are co-axially aligned, they are subjected to a magnetic field of relatively large intensity for the purpose of permanently joining such components together. This relatively large intensity magnetic field exerts a large pressure on one of the two components, causing it to deform toward the other of the two components at a high velocity. The high velocity impact of these two components, as well as the large pressures exerted thereon, caused the two components to become permanently joined together.
Owner:METALSA SA DE CV

Group iii nitride semiconductor light-emitting device and method for producing the same

ActiveUS20140084241A1Strain applied to the light-emitting layer is relaxedEnhanced glowSemiconductor/solid-state device manufacturingSemiconductor devicesContact layerLight emission
The invention provides a Group III nitride semiconductor light-emitting device in which the strain in the light-emitting layer is relaxed, thereby attaining high light emission efficiency, and a method for producing the device. The light-emitting device of the present invention has a substrate, a low-temperature buffer layer, an n-type contact layer, a first ESD layer, a second ESD layer, an n-side superlattice layer, a light-emitting layer, a p-side superlattice layer, a p-type contact layer, an n-type electrode N1, a p-type electrode P1, and a passivation film F1. The second ESD layer has pits X having a mean pit diameter D. The mean pit diameter D is 500 Å to 3,000 Å. An InGaN layer included in the n-side superlattice layer has a thickness Y satisfying the following condition: −0.029×D+82.8≦Y≦−0.029×D+102.8.
Owner:TOYODA GOSEI CO LTD

X-ray diffraction apparatus and x-ray diffraction method

In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror has a shape of an equiangular spiral that has a center located on the surface of the sample. A crystal lattice plane that causes reflection is parallel to the reflective surface at any point on the reflective surface. The X-ray detector is one-dimensional position sensitive in a plane parallel to the diffraction plane. A relative positional relationship between the mirror and the X-ray detector is determined so that reflected X-rays from different points on the reflective surface of the mirror reach different points on the X-ray detector respectively. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure.
Owner:RIGAKU CORP

Method and its apparatus for inspecting defects

A defect inspection apparatus is capable of inspecting an extremely small defect present on the top and edge surfaces of a sample such as a semiconductor substrate or a thin film substrate with high sensitivity and at high speed. The defect inspection apparatus has an illumination optical system, a plurality of detection optical units and a signal processor. One or more of the detection optical units receives either light diffracted from an edge portion of the sample or light diffracted from an edge grip holding the sample. The one or more of the detection optical units shields the diffracted light received by the detection optical unit based on a signal obtained by monitoring an intensity of the diffracted light received by the detection optical unit in order to inspect a sample portion located near the edge portion and a sample portion located near the edge grip.
Owner:HITACHI HIGH-TECH CORP

Transferring electric energy to a vehicle

The invention relates to a system for transferring electric energy to a track bound vehicle, in particular to a light rail vehicle, such as a tram, wherein the system comprises an electric conductor arrangement (12) for producing an electromagnetic field and for thereby transferring the energy to the vehicle, the electric conductor arrangement (12) comprises at least one line (1, 2, 3) for carrying one phase of an alternating voltage or current, the line (1, 2, 3) extends along the track, the line (1, 2, 3) is arranged in such a manner that it produces—at each point in time while the alternating electric current is flowing through the line (1, 2, 3)—a row of successive magnetic poles (at sections 5) of an electromagnetic field, wherein the successive magnetic poles have alternating magnetic polarities, the row of successive magnetic poles extends in the travel direction of the vehicle which is defined by the track.
Owner:BOMBARDIER TRANSPORTATION GMBH

Sheet-fed scanning device capable of detecting a document edge

ActiveUS20050141055A1Facilitate document edge detectionFacilitate document edge detection documentPictoral communicationPaper documentDocument preparation
A sheet-fed scanning device capable of detecting a document edge includes a scanning module and an automatic document feeder. The scanning module scans a document with a light ray. The automatic document feeder feeds the document across a scanning region on a sheet passageway for the scanning module to scan. In this invention, a section of a guide plate of the sheet passageway located within the scanning region is formed with a concave portion, wherein the document moving across the scanning region is located between the concave portion and the scanning module, such that the intensity of a first brightness of the concave portion sensed by the scanning module is far smaller than the intensity of a second brightness of the document sensed by the scanning module. Thus, it is possible to facilitate the document edge detection and the document skew correction.
Owner:AVISION

Crash box arrangement and method of detecting the intensity of an impact

A crash box arrangement includes a hollow member having a first hardness and defining a hollow space in communication with at least one ventilation opening; and a damper having a second hardness which is smaller than the first hardness. The damper has an impulse cavity in communication with the hollow space of the hollow member.
Owner:BENTELER AUTOMOBILTECHNIK GMBH

X-ray diffraction method and x-ray diffraction apparatus

In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror consists of a combination of plural flat reflective surfaces. The respective centers of the flat reflective surfaces are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A corrective operation is performed for separately recognizing the different reflected X-rays on the assumption that the different reflected X-rays that have been reflected at the different flat reflective surfaces might be unfortunately mixed each other on the same detecting region of the X-ray detector. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure.
Owner:RIGAKU CORP

Signal processing apparatus, ultrasonic apparatus, control method for signal processing apparatus, and control method for ultrasonic apparatus

A signal processing apparatus scans a beam of elastic waves into an object to be examined, acquires received waveform data of a plurality of scan lines, and performs signal processing to form a tomographic image of said object to be examined from the received waveform data of the plurality of scan lines. The signal processing apparatus includes a scan line correlation calculation part (009) that calculates a correlation value of received waveform data between a first scan line and a second scan line that has a prescribed correlation with the first scan line, for a plurality of positions on the scan lines, and a correlation change position extraction part (010) that extracts, from among the plurality of positions on said scan lines, a position at which the correlation value becomes a value different from a prescribed value as a position at which a unique region can exist.
Owner:CANON KK

Document reading apparatus

A document reading apparatus includes a white LED including an LED and a fluorescent material and configured to illuminate a document reading position with light, a reading unit having a color line sensor and a monochrome line sensor and configured to read an image of a document illuminated with the light emitted from the white LED, and a filter arranged on an optical path between the monochrome line sensor and the document, and wherein the filter is configured to suppress transmission of light at a peak wavelength of the LED so that, regarding an intensity of light to be received on the monochrome line sensor, the intensity of the light at the peak wavelength of the LED is smaller than the intensity of the light at the peak wavelength of the fluorescent material when the light emitted from the LED is received.
Owner:CANON KK

X-ray radiator to generate quasi-monochromatic x-ray radiation, and radiography x-ray acquisition system employing same

For a quasi-monochromatic x-ray radiation with high radiation intensity, an x-ray radiator generates quasi-monochromatic x-ray radiation to expose a subject from a point-shaped radiation source that emits a polychromatic x-ray radiation, and having a diffraction device to diffract the polychromatic x-ray radiation. The diffraction device has a super-mirror made of crystalline material with a flat surface. In the super-mirror, the crystalline material has at least one (in particular continuous) variation of the lattice plane spacing of the crystal lattice. The radiation source and the diffraction device are arranged such that quasi-monochromatic x-ray radiation is generated from the polychromatic x-ray radiation by partial reflection at the super-mirror.
Owner:SIEMENS HEALTHCARE GMBH
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