The invention discloses a
test bench for X-
ray detection apparatuses. The
test bench is characterized in that a start-up circuit with a
DC voltage is connected to earthing pins and
milliampere (mA) output pins of a controller output port and a handpiece output port, a high-
voltage packet test circuit with an adjustable output
voltage is connected with two high-
voltage packet voltage output pins of the handpiece output port, two high-voltage packet voltage supply output pins of the controller output port are connected with a waveform display instrument, the two high-voltage packet voltage output pins and pseudo loads of the handpiece output port are respectively connected in series with a normally
open contact of an AC
relay and then connected in parallel with the waveform display instrument, a
control circuit for switching the mutually-
exclusive access of the two high-voltage packet voltage output pins and the pseudo loads as well as adjustable alternating voltage loads is composed ofthree AC relays and three sets of button switches; and a X-
ray machine technical parameter and waveform
display device is composed of a
voltmeter, an
ammeter and a waveform display instrument. By using the
test bench for X-
ray detection apparatuses disclosed by the invention, the performance parameters, working conditions and failure positions of a controller of an X-ray
machine, a handpiece and a handpiece high-voltage packet can be diagnosed through onekey operation, therefore, the test bench disclosed by the invention can be widely used in the performance test and fault diagnosis and maintenance of the X-ray
machine.