The invention discloses a probe test bench for semiconductor processing, and belongs to the field of semiconductor processing. A probe test bench for semiconductor processing comprises a base and a test platform, the test platform is located on the base, a test mechanism is arranged on the test platform, a test instrument is arranged in the base, the test mechanism is electrically connected with the test instrument, a moving groove is formed in the test platform, a fixing plate is slidably connected in the moving groove, a placement groove is formed in the fixing plate, a cavity is formed in the fixing plate, and the cavity is located below the placement groove. According to the invention, through the arrangement of the cavity, the heat conducting plate, the air pumping and exhausting mechanism, the air bin and the heating mechanism, the influence of temperature change on the performance of the semiconductor is conveniently tested, through the arrangement of the clamping mechanism, the semiconductor is conveniently clamped and fixed, and through the arrangement of a moving groove, a threaded rod and a fixed plate, the position of the semiconductor is conveniently adjusted; and the arrangement of an air pipe, a second rotating shaft and fan blades facilitates heat dissipation and cooling of the test instrument.