The invention provides a wheat
leaf area index whole growth period
estimation method based on
canopy pure hyperspectral
reflectivity, which comprises the following steps of: firstly, extracting wheat
canopy spike, leaf and soil pure pixels based on an RGB (Red, Green and Blue) image combined with a
deep learning algorithm; secondly, separating the
canopy pure leaf hyperspectral
reflectivity by using the extracted pure pixels and canopy hyperspectral
reflectivity data in combination with a non-negative matrix factorization
algorithm; and finally, calculating a
vegetation index based on the canopy pure leaf hyperspectral reflectivity, and establishing a whole-growth-period LAI
estimation model in combination with a
simple linear regression algorithm. According to the method, the problem that the LAI inversion precision is reduced after heading is solved by combining near-end
remote sensing and a
machine learning algorithm, and the wheat LAI
estimation method based on the canopy pure hyperspectral reflectivity has the potential of accurately predicting the LAI of the wheat in the whole growth period and can be expanded to accurate management of field crops and breeding of high-yield wheat varieties.