The invention relates to a method for predicting the
creep performance of
oxide dispersion strengthened (ODS) steel under high temperature and high
irradiation conditions. A complex
crystal plasticity constitutive model is developed to accurately predict the performance of ODS steel in terms of
irradiation hardening and
creep behavior, which incorporates the
spatial distribution of voids and oxides. This developed model is highly consistent with experimental data at different temperatures and
irradiation doses, demonstrating its strong robustness. As the irradiation
dose increases, the yield stress of irradiated ODS steel also increases. The yield strength of ODS steel shows a
linear relationship with the irradiation
dose, which initially increases with the increase of irradiation
dose and then decreases. The void size steadily increases, while the void spacing initially decreases and then increases. Therefore, the void
hardening effect gradually weakens after the initial enhancement. In contrast, as the irradiation temperature increases, the yield strength decreases due to the expansion of the void spacing at higher temperatures. The
creep rate of irradiated ODS steel is nonlinearly related to the irradiation dose. ODS steel irradiated at low or
high doses has relatively poor creep performance and exhibits a higher
creep rate under low applied stress. In contrast, at moderate doses, the creep performance is better due to the small number of irradiated voids and high strength of
oxide particles. And spherical voids exhibit better creep resistance, and the void spacing has a more significant
impact on the creep performance than the void size. At low and
high doses, the creep performance decreases as the irradiation temperature increases, and in addition, at lower doses, the effect of irradiation temperature on creep performance is not as significant as at higher doses. This invention provides an efficient theoretical method for accurately evaluating the irradiation performance of ODS steel under complex environments.