A
system and method automatically analyzes and manages
loss factor data of test processes in which a great number of
IC devices are tested as a lot with a number of testers. The lot contains a predetermined number of identical
IC devices, and the lot test process is performed sequentially according to a predetermined number of test cycles. The
system include a means for verifying test results for each of the test cycles and for determining whether or not a re-test is to be performed and an IC device loading / unloading means for loading
IC devices to be tested and contained in the lot to a test head and for unloading the tested IC devices from the test head by sorting the tested IC devices according to the test results. The
system also includes
raw data generating means for generating
raw data on the basis of
time data occurring when the test process is performed; data calculating means for calculating testing
time data, index
time data based on the
raw data, and loss time data; data storage means for storing the raw data and the
calculated data; and data analyzing and outputting means for analyzing the raw data and the
calculated data according to the lots, the plurality of testers and the IC device loading / unloading means and for outputting the analyzed output through an
user interface. The test system includes testers, a
server system and terminal computer, and the
server system is provided with data storage means for integrally manipulating time data generated by the testers according to lots and test cycles and for storing manipulated time data.