A 
system and method automatically analyzes and manages 
loss factor data of test processes in which a great number of 
IC devices are tested as a lot with a number of testers. The lot contains a predetermined number of identical 
IC devices, and the lot test process is performed sequentially according to a predetermined number of test cycles. The 
system include a means for verifying test results for each of the test cycles and for determining whether or not a re-test is to be performed and an IC device loading / unloading means for loading 
IC devices to be tested and contained in the lot to a test head and for unloading the tested IC devices from the test head by sorting the tested IC devices according to the test results. The 
system also includes 
raw data generating means for generating 
raw data on the basis of 
time data occurring when the test process is performed; data calculating means for calculating testing 
time data, index 
time data based on the 
raw data, and loss time data; data storage means for storing the raw data and the 
calculated data; and data analyzing and outputting means for analyzing the raw data and the 
calculated data according to the lots, the plurality of testers and the IC device loading / unloading means and for outputting the analyzed output through an 
user interface. The test system includes testers, a 
server system and terminal computer, and the 
server system is provided with data storage means for integrally manipulating time data generated by the testers according to lots and test cycles and for storing manipulated time data.