80 results about "GgNMOS" patented technology

An ESD protection device is provided. The ESD protection device includes a first group of electrostatic discharge protection devices connected to a first terminal and including at least one of an LORGGR and an HORGGR, and a second group of electrostatic discharge protection devices connected in series to the first group of electrostatic discharge protection devices and a second terminal and including at least one of a GGNMOS, a GGPMOS and a diode.

An electrostatic discharge protection element is disclosed for protecting an internal circuit from electrostatic current. The electrostatic discharge protection element forms an embedded LVTSCR by adding a prescribed impurity region within an N-well region having a P-type diode formed therein. A P-well region having a GGNMOS transistor is also formed in the electrostatic discharge protection element. The embedded LVTSCR improves area efficiency, reduces a resistance, and lowers an operational voltage by reducing the distance between the P-type diode and the LVTSCR to allow high-speed operatation.

The invention provides a GGNMOS device used in an ESD protective circuit. The device comprises a substrate and a P trap region positioned on the substrate, wherein a plurality of drain electrode regions are arranged in the P trap region; the surface of the P trap region and two sides of the drain electrode regions are provided with grid electrode regions; the P trap region and the other sides of the grid electrode regions are provided with source electrode regions; P type doped regions are arranged among the source electrode regions; and a position below the source electrode regions and close to the source electrode regions is provided with an N trap region. The GGNMOS device used in the ESD protective circuit not only can solve non-uniform triggering problems, but also can solve the problems of resistance reduction, trigger voltage raising and difficult leakage of electrostatic current in a leakage path.

The invention relates to a semiconductor structure for electrostatic discharge protection, which includes a ground gate NMOS, and the ground gate NMOS has a substrate, a gate, a source and a drain. A plurality of contact plugs are formed on the source and drain sides. A plurality of first-level vias are electrically coupled to the GGNMOS and have a substantially asymmetrical layout in the source and drain regions. One or a group of second-level vias directs the ESD current to the desired first-level vias. The uniformity of current flow in the GGNMOS is thus improved.

An electrostatic discharge protection structure includes a laterally diffused metal oxide semiconductor (LDMOS) device. The LDMOS device includes an embedded bipolar junction transistor. A gate, a source, a buried layer lead-out area, and a substrate lead-out area of the LDMOS device are grounded. A drain and a body region lead-out area of the LDMOS device are electrically connected to a pad input/output terminal. In an embodiment, the embedded bipolar junction transistor includes a PNP transistor operative to transmit a reverse electrostatic discharge current. An N+ drain, a gate, an N+ source, and a P+ substrate lead-out area form a grounded-gate NMOS (GGNMOS) operative to transmit a forward electrostatic discharge current.

The invention provides a multi-finger strip-type gate-ground N-channel metal oxide semiconductor (GGNMOS) and an electrostatic protection circuit. The multi-finger strip-type GGNMOS comprises a P-type semiconductor substrate, at least two N-channel metal oxide semiconductor (NMOS) transistors formed in a device region, and an N-type connecting pit positioned in a semiconductor substrate arranged between drains of adjacent NMOS transistors; the P-type semiconductor substrate comprises the device region; the N-type connecting pit is connected with the drains on the two sides of the N-type connecting pit; and an N-type connecting region is formed in a surface region of the N-type connecting pit. The multi-finger strip-type GGNMOS provided by the invention has high conduction uniformity.

The invention provides a high-voltage ESD protective circuit which is used for discharging ESD current that flows from an IO PAD. The high-voltage ESD protective circuit at least comprises the components of a GDPMOS discharging unit which is arranged between a power supply and the IO PAD; an auxiliary discharging unit which is arranged between the IO PAD and ground and is connected with the GDPMOS discharging unit; and a GGNMOS discharging unit which is connected with the auxiliary discharging unit, wherein the auxiliary discharging unit is used for supplying an auxiliary discharging path of the GGNMOS discharging unit. The auxiliary discharging unit of the invention can supply the auxiliary discharging path of the GGNMOS discharging unit and improves ESD capability. By means of the stacked structure for aiming at high-voltage process, ESD capability of the circuit can be improved, and furthermore triggering voltage and noise resistance of the whole high-voltage ESD protective circuit can be improved, thereby preventing misoperation of the whole high-voltage ESD protective circuit caused by noise.

Provided is an electrostatic discharge (ESD) protection circuit using a silicon controlled rectifier (SCR), which is applied to a semiconductor integrated circuit (IC). A semiconductor substrate has a triple well structure such that a bias is applied to a p-well corresponding to a substrate of a ggNMOS device. Thus, a trigger voltage of the SCR is reduced. In addition, two discharge paths are formed using two SCRs comprised of PNP and NPN bipolar transistors, with the result that the ESD protection circuit can have great discharge capacity.

A MSMV (Multi-supply Multi-voltage) integrated circuit ESD protection network under an epitaxial technology comprises a power supply VIO, an earth VSSIO, a power supply VCORE, an earth VSSCORE, a diode DD1, a diode DD2, a diode DD3, a first VIOSCR protection circuit, a second VIOSCR protection circuit, a third VIOSCR protection circuit, a VCORESCR protection circuit and an IO PAD; the first VIOSCR protection circuit is arranged between the power supply VIO and the earth VSSIO; the VCORESCR protection circuit is arranged between the power supply VCORE and the earth VSSCORE; the second VIOSCR protection circuit and the third VIOSCR protection circuit are respectively arranged between the IO PAD and the power supply VIO and between the IO PAD and the earth VSSIO for protections. The normal ESD design (GGNMOS) under the epitaxial technology has a protection failure problem, and a MSMV (Multi-supply Multi-voltage) integrated circuit ESD is hard and complex to design; the MSMV (Multi-supply Multi-voltage) integrated circuit ESD protection network under the epitaxial technology can solve said problems, thus effectively realizing MSMV (Multi-supply Multi-voltage) integrated circuit ESD protections; the protection network uses a limited layout area, provides a strong ESD robustness, and can improve the ESD protection efficiency.

The invention discloses an ESD (Electro-Static Discharge) protective circuit suitable for RFID (Radio Frequency Identification Devices). The ESD protective circuit comprises a GC-GGNMOS (Gate Coupled Gate Grounded N-channel Metal Oxide Semiconductor), wherein the GC-GGNMOS takes a stray capacitor in an inherent grid and drain overlapped region as a coupling capacitor, and the RC parameters of the GC-GGNMOS are regulated by changing the resistance value of a polycrystalline silicon resistor which connects the grid to the ground. The invention also discloses an RFID chip, and the RFID chip comprises packaged pins, an RFID chip internal circuit and the ESD protective circuit which is positioned between the packaged pins and the RFID chip and has a protective effect, wherein the ESD protective circuit comprises the GC-GGNMOS, the GC-GGNMOS takes the stray capacitor in the inherent grid and drain overlapped region as the coupling capacitor, and the RC parameters of the GC-GGNMOS are regulated by changing the resistance value of the polycrystalline silicon resistor which connects the grid to the ground. The embodiment of the invention reduces the robustness index of the protective circuit and reduces the robustness of the protective circuit.

Apparatus for ESD circuit protection including a trigger subcircuit coupled between a first voltage reference potential and second voltage reference potential and an ESD shunt subcircuit coupled to the trigger subcircuit between a circuit device to be ESD-protected and the second voltage reference potential. The ESD shunt subcircuit is adapted for connection by a pad of an integrated circuit (IC) connection. The ESD shunt subcircuit is a silicon-controlled rectifier (SCR) that has an anode connected to the circuit device to be ESD-protected and a cathode connected to the second voltage reference potential. The trigger subcircuit is either an RC-triggered PMOS or a GGNMOS and series connected resistor.

The invention provides a semiconductor structure, a forming method thereof, and an electrostatic protection circuit. The forming method includes the following steps: providing a substrate including a device zone; forming a plurality of well regions, in the substrate of the device zone, that are isolated through the substrate; forming grid structures on the surfaces of the well regions; and forming a source region at one side of each grid structure in the corresponding well region, and forming a drain region at the other side of each grid structure in the substrate, wherein the drain regions cross the adjacent well regions, and the adjacent grid structures share the source regions and the drain regions. A plurality of well regions are formed in the substrate of the device zone and are isolated by means of the substrate, so part of the drain regions are positioned in the well regions and part of the drain regions are positioned in the substrate. The stray capacitance of a GGNMOS (Gated Grounded NMOS) is influenced by the concentration of doped ions, and the lower the concentration of the doped ions is, the lower the stray capacitance is, while the concentration of doped ions of the substrate is smaller than the concentration of doped ions of the well regions. Therefore, the stray capacitance of the GGNMOS can be made to be reduced, the input/output time delay can be reduced, and the working speed of a chip can be increased.

The invention provides an electrostatic protection device based on a SOI (Silicon-On-Insulator) technology and a formed electrostatic protection circuit. The device is a GGNMOS with a multiple parallel structure, and comprises a buried oxide layer, a P well area, a source, a drain, a gate, a P+ contact area and a pseudo gate, wherein the P+ contact area is arranged at one side, far away from the drain, of the source; the P+ contact area is separated from the source through the P well area; and the pseudo gate covers the P well area between the P+ contact area and the source. Thus, the reverseESD protection capability can be improved.

The invention is concerned with electrostatic-proof protecting structure using NMOS as the basic device of static protecting structure. The number of NMOS is even and is not less than four and adding N well resistance in confined field at the drain area. Set two NMOS at the center of static protecting structure and those grids connect in parallel connection, while the drain pole is in parallel connection. Except the central NMOS, the NMOS drain pole on the both sides is in parallel connection with the central NMOS, and source pole and grid connect with central NMOS in parallel connection and the earth. The source pole of central NMOS connects with the underlay of the parallel NMOS on both sides, i.e. the group pole of parasitical NPN. When the parasitical NPN of central NMOS is expedite, the current distributes to the group poles of parasitical NPN to parallel NMOS on both sides and the group poles are positive expedite with sending pole. This invention solves the problem that protective tube cannot expedite flow equably and the protection ability of ESD is low, when the GGNMOS structure is as the protection of ESD.

The invention provides a static discharge protection circuit which is characterized by comprising a plurality of N-metal-oxide-semiconductor (NMOS) transistors. The adjacent NMOS transistors share source diffusion zones or drain diffusion zones. P traps are formed below the drain diffusion zones. A picking area is formed in the central area of the shared source diffusion zones. Grids and sources of the NMOS transistors are grounded. The picking area is also grounded. According to the static discharge protection circuit, when static discharge occurs, each finger in a grounded-gate N-metal-oxide-semiconductor (GGNMOS) simultaneously starts static discharge protection, and improves static discharge protection level measured by human body model (HBM).

The invention relates to a semiconductor device with an electrostatic discharge protection structure and a layout structure thereof, the device includes an internal circuit and a GGNMOS, the internalcircuit includes a MOSFET, the semiconductor device further includes an active region, A MOSFET is arrange in that active region, characterized by, GGNMOS is also arrange in that active region, and the MOSFET is arranged on both lateral sides of the GGNMOS in the same active region, The active region comprises a P well, an N-type doped region of the GGNMOS and an N-type doped region of the MOSFETare arranged in the P well, the semiconductor device further comprises a P-type doped region as a substrate, and the P-type doped region is arranged on the outer sides of the MOSFET on both sides. When the electrostatic discharge occurs, if the MOSFET of the internal circuit is turned on, the substrate current is formed, thereby increasing the gate voltage of the intermediate GGNMOS, enabling theGGNMOS to be turned on more easily and improving the ESD capability.

The invention discloses an electrostatic protection GGNMOS structure, which is suitable for an interdigital GGNMOS of an SOI process. In the upper layer of the substrate, an active region is defined through an STI process, a plurality of P wells are formed in the active region, and the plurality of P wells are mutually spaced; a heavily doped N-type injection region is arranged between the P trapand the peripheral STI; heavily doped N-type injection regions are arranged between the P wells at intervals; the heavily doped N-type injection region is in transverse contact with the P trap; and aheavily doped P-type injection region is arranged between the P wells in the central region, and the heavily doped P-type injection region is in transverse contact with the P wells on the two sides ofthe heavily doped P-type injection region. According to the invention, through the P trap and the heavily doped P-type injection region in the central region, each insertion finger forms a body diodefrom S/B to the drain end, so that the ESD capability of the GGNMOS in the direction of the body diode is enhanced.

An electrostatic discharge (ESD) protection device includes a pad, a diode, a gate ground NMOS (GGNMOS) transistor and a thyristor. The diode includes an anode connected with the pad. The GGNMOS transistor is connected between a cathode of the diode and a ground terminal. The thyristor is formed between the diode and the ground terminal when an ESD current may flow from the pad.

The invention discloses an electrostatic discharge protection circuit. The electrostatic discharge protection circuit comprises a gate-grounded N type metal oxide semiconductor (GGNMOS) transistor located on a semiconductor substrate, a drain electrode of the GGNMOS transistor is connected an input/output end of a chip circuit, a source electrode and a gate electrode and the semiconductor substrate are all connected to the ground; and the circuit also comprises a Peltier cooling element that is located near the GGNMOS transsitor and used for absorbing heat generated by the GGNMOS transistor. The invention also discloses a manufacturing method of the electrostatic discharge protection circuit. By adoption of the electrostatic discharge protection circuit, the working life of an ESD protection device can be prolonged.

The invention discloses a quick-opening uniform-conduction bidirectional electrostatic surge protection IC, and belongs to the field of electrostatic discharge and surge protection of circuits. By introducing a reverse bias unit composed of an N type buried layer and a P well, bidirectional electrostatic surge protection is carried out on an application circuit of which the working voltage is higher than 18V; by adjusting the width of the P trap, the voltage clamping capability of the bidirectional electrostatic surge protection IC is adjusted. By introducing the on-state NMOS, the current conduction uniformity of the surface of the P trap is enhanced, and the starting speed of the bidirectional electrostatic surge protection IC is improved. By introducing a cascaded electrical structure of a GGNMOS and an on-state NMOS, the surface current discharge capability of the bidirectional electrostatic surge protection IC can be enhanced, and the ESD robustness of the bidirectional electrostatic surge protection IC can also be enhanced. On the premise that the area of the chip is not increased, the bidirectional electrostatic surge protection IC also has bidirectional ESD/TVS protection performance.

The invention discloses a GGNMOS (Gate-Grounded N-channel Metal Oxide Semiconductor) device applied to ESD (Electro-Static discharge) protection and a manufacturing method thereof. A P-type doping region is arranged in a drain extension region of a GGNMOS to form a floating reverse diode with a drain NLDD (N-type Lightly Doped Drain) doping region, so that distribution of drain ESD current is changed; ESD leakage current is deviated from the surface of the drain extension region and a conducting channel; the cooling capability during ESD discharge of the GGNMOS is enhanced; secondary breakdown current during snapback of the device is increased; and the ESD protection capability of the GGNMOS device is enhanced.

An enhanced ESD clamp is provided with a resistor connected between the body terminal and the source terminal of a MOSFET device. In one exemplary embodiment, the MOSFET device is a grounded-gate NMOS (ggNMOS) transistor device with the resistor ('body resistor') connected externally to the MOSFET device. In another embodiment, the MOSFET device is a ggPMOS transistor device. In yet another embodiment, the body resistor is disposed within and connected internally to the MOSFET device. In any event, the resistance value of the body resistor determines the level to which the trigger voltage of the ESD clamp will be reduced when an ESD event occurs.

The invention relates to a gate-grounded NMOS (GGNMOS) manufacturing method which includes the following steps. A P-shaped semi-conductor substrate is provided. A gate insulation layer and a grid electrode are sequentially formed on the semi-conductor substrate, source drain implantation is performed, an interlamination medium layer is formed, a through hole of a contact hole is formed in an etching mode and ESD ion filling is performed by using the formed through hole as a reticle mask. Compared with that ESD filling is performed before the contact hole is formed in manufacturing the GGNMOS, performing the ESD filling after the through hole of the contact hole is formed can not only reduce procedures of original technology, narrow down an ESD Implant zone in a drain electrode and reduce leakage, but also reduce grid leak parasitic capacitance caused by horizontal spreading and improve static protection characteristics of the GGNMOS.