The invention specifically discloses an AES encrypted circuit-oriented anti-
radiation soft error analysis method based on CVPI, and relates to the technical field of
integrated circuit reliability testing. The method comprises the following steps: S1, inputting single-particle
soft error simulation parameters; s2, synthesizing a
register transfer level RTL code of the AES
encryption circuit into a
netlist; s3, the RTL and the gate-level
netlist of the AES encrypted circuit are analyzed, and RTL instance representation information and
netlist unit information are extracted; s4, constructing a single-particle
soft error database; s5, based on the upset section model and Poisson distribution time modeling, generating a single-particle soft error injection
list; s6, performing batch single-particle soft error injection on the AES encrypted circuit based on the user-defined CVPI interface; and S7, generating an AES encrypted circuit single-particle soft
error analysis report. According to the method, the precision and efficiency of anti-
radiation soft
error analysis of the AES
encryption circuit are improved, and support is provided for design of a high-reliability
encryption chip.