A comprehensive
inspection method and
system for secondary devices based on a monitoring background, the method comprising: using secondary device information and a secondary device
template library, adopting a forward maximum matching
algorithm, classifying the type of secondary devices and the analog quantity and
signal quantity of the secondary devices; according to the inspection content, the monitoring host determines the type, analog quantity and / or
signal quantity type of the secondary device to be inspected; collects the analog quantity and / or
signal quantity that conforms to the analog quantity and / or signal quantity type in the secondary device to be inspected; and obtains the inspection result through inspection module
processing. The present invention first determines the type of secondary devices involved in the inspection according to the inspection content of the secondary devices, so as to narrow the inspection scope, and then collects the analog quantity and signal quantity corresponding to each secondary device within the determined inspection scope according to the inspection content, so that the monitoring host only needs to collect the corresponding information according to different inspection contents, thereby reducing the amount of
information processing, speeding up the inspection process, and facilitating the simultaneous inspection of multiple devices.