4 results about "Beam emittance" patented technology

The present invention discloses a beam four-dimensional emittance measuring instrument and measurement method based on orthogonal slits. A charged particle beam is incident on a slit assembly from the side of a first slit plate away from a second slit plate. After passing through the first slit, the charged particle beam forms a first beam group that is transmitted to the second slit plate. After passing through the second slit, the first beam group forms a second beam group that is transmitted to a fluorescence collection assembly. The fluorescence collection assembly includes a fluorescent screen and an image acquisition module. The fluorescent screen is used to receive the second beam group and generate fluorescence. The image acquisition module is used to collect the fluorescence pattern emitted by the second beam group bombarding the fluorescent screen. The data processing assembly is used to calculate the phase space distribution of the beam based on the fluorescence image and measure the emittance of the charged particle beam based on the phase space distribution. The beam four-dimensional emittance measuring instrument provided by the present invention can obtain a more complete four-dimensional phase space distribution by dividing the beam through slits in orthogonal directions, thereby increasing the completeness and accuracy of beam emittance measurement.

The invention discloses a pepper hole method beam measurement system and method, a processor and a storage medium. The pepper hole method beam measurement system comprises a data acquisition module and a data processing module, relates to the technical field of beam measurement, and solves the technical problem that the accuracy and efficiency of beam measurement are not high due to the fact that the scheme in the prior art is difficult to realize overall optimization on the premise of ensuring the real-time performance and precision. According to the method, the divergence angle is calculated based on the hole screen distance, the beam spot mass center and the center coordinate of the theoretical hole position; performing optimal matching on the beam spot mass center and the pepper pore plate based on a Hungary algorithm; and processing the beam spot centroid and the divergence angle in the phase space based on ellipse fitting to obtain the beam emittance and the beam envelope. According to the method, the optimal matching of the beam spot mass center and the theoretical hole site is realized through the Hungary algorithm, and the position deviation is effectively eliminated and the matching efficiency is improved through the organic combination of algorithm optimization and the phase space model, so that the improvement of the precision and efficiency of beam measurement is facilitated.

This invention relates to the field of charged particle beam parameter measurement technology, and provides a compact pepper pot emittance measuring instrument with absolute current intensity calibration. It includes a "pepper pot" planar component, a fluorescent screen component, an observation window, and a camera system. The "pepper pot" planar component is integrated with a multi-layer structure, wherein the beam measurement layer uses a specially designed Faraday cylinder to directly measure beam intensity for calibration of measurement results. The fluorescent screen supports longitudinal position adjustment via a movable mounting bracket. The camera system can focus on the fluorescent screen and take pictures. This invention, through innovative structural design and dynamic calibration technology, eliminates the nonlinear distortion problem between grayscale value and beam intensity, improves measurement accuracy, achieves high-precision beam screening, improves the ability to capture weak beam signals, and can quickly calculate beam emittance. It is suitable for rapid and accurate measurement of charged particle beam emittance in fields such as particle accelerators.

The application discloses a kind of space charge compensation degree measuring device and measuring method, it is related to accelerator technical field, including detachable electrode, one end of the detachable electrode is fixedly connected with first diagnostic mechanism, the other end is fixedly connected with second diagnostic mechanism, one end of the first diagnostic mechanism is fixedly connected with one end of the solenoid magnet, the other end of the solenoid magnet is fixedly connected with the ion source;The first diagnostic mechanism is used to measure the beam emittance and beam intensity of the detachable electrode entrance end, and the second diagnostic mechanism is used to measure the beam emittance and beam intensity at the outlet of the detachable electrode.The application provides a kind of space charge compensation degree measuring device, to measure and analyze the space charge compensation degree in the design stage of accelerator, provides the space charge compensation degree measuring method for the design of accelerator, can support the design of accelerator to improve reliability.