57results about How to "Reduce scattered light" patented technology

Aspects of the present invention relate to methods and systems for providing a high quality display images in see-through head-worn optics.

A substrate for fingerprint contact includes a plate, and the plate includes a first surface and a second surface. The first surface is an optical diffusing surface. The optical diffusing surface is used for being contacted by a finger, and features hazed particles. The second surface faces an optical imaging system. The optical diffusing surface of the plate helps to enhance light to be evenly emitted to the finger and weakens the unnecessary scattered light to the optical imaging system, so as to enhance the recognition rate of a fingerprint when the optical imaging system is used for intercept the light applied on a finger.

The invention provided a grid for radiography, a radiation image detector, a radiation imaging system, and a method for manufacturing grid. Periodic electrodes in a pattern of many lines are formed on a first surface of a nonlinear single crystal substrate. The nonlinear single crystal substrate is put in a vacuum chamber, and heated with a heater. Then, high voltage is applied to the nonlinear single crystal substrate. Thus, the direction of spontaneous polarization of the nonlinear single crystal substrate is reversed in portions facing to the periodic electrodes, which are referred to as reversed portions. After the nonlinear single crystal substrate is bonded to a support substrate, only non-reversed portions of the nonlinear single crystal substrate are removed by wet etching, and grooves with a high aspect ratio are left between the remaining reversed portions. The grooves are filled with an X-ray absorbing material such as gold. The grooves filled with the gold compose X-ray absorbing portions of a grid, while the reversed portions compose X-ray transparent portions.

The optical element is provided with a computer composition hologram which is manufactured based on interference fringe data obtained by a computing method of individually computing the interference with reference to all the combination of a plurality of reference light R reaching the position and a plurality of object light M reaching the same position and summing up the interference data, in computing the interference generated by the reference light and the object light reaching every position on a hologram-formed surface by computer, on the other hand, computing the interference without taking the interference of the reference light R with the reference light R in the position into account.

The invention relates to a microscopic cell observation and inspection system that uses a total internal reflection cell illuminator that is capable of freely changing an observation position without recourse to any special slide glass, makes sure high SN-ratio observation and facilitates sample manipulation, thereby making high-sensitivity, fast detection of a lot of cell reactions on the same slide glass. While, in response to a command from personal computer (80), step motors (53, 54) are driven to sequentially scan observation positions of cell sample (S) on slide glass (21), one of shutter units (71) and (72) is closed and the other is opened at high speed, whereby either one of illumination optical paths for a TIRF microscope and a drop fluorescence microscope is selected to illuminate cell sample (S) on that observation position. When the drop fluorescence microscope is chosen, filter unit (66) is driven to choose the wavelength of excitation light from drop fluorescence illumination light source (65), so that observation and inspection of cell sample (S) under the TIRF microscope and drop fluorescence microscope can be implemented in an alternate fast switchover way.

The object of the present invention is to provide an optical filter for a solid-state image pickup device, and a solid-state image pickup device and a camera module using the same, which overcome drawbacks of conventional optical filters such as near-infrared cut filters and generate little scatted light even during light absorption and has excellent transmittance property. The optical filter of the present invention is characterized by containing a squarylium-based compound and a compound which absorbs or quenches fluorescence of the squarylium-based compound. The optical filter of the present invention preferably contains a near-infrared absorbing dye containing a squarylium compound (A) and at least one compound (B) selected from the group consisting of a phthalocyanine-based compound (B-1) and a cyanine-based compound (B-2).

An LED module is mounted on a case frame by fitting three pins formed at a concave portion of the case frame, into holes in the LED module corresponding to the pins. A light-guide plate is fitted into the case frame formed integrally with a bottom cover in a descending direction. The light-guide plate is fixed by a hook provided for the case frame. A space between the light-guide plate and the LED module is prevented by pressing the light-guide plate to the LED module with a pressing spring. Since the light-guide plate is fitted into the case frame in the descending direction and a light scattering sheet is adhered to an outer end surface of the case frame in the descending direction, it is not necessary to reverse the worked product and so the number and time of working processes can be saved.

The present invention relates to a semiconductor light emitting device including: a substrate for element mounting; a wiring provided on the substrate; an LED element provided on the substrate and electrically connected to the wiring; an encapsulating resin layer for encapsulating the LED element; and a wavelength conversion layer which contains a phosphor material and converts a wavelength of light emitted by the LED element, in which the wavelength conversion layer is provided on an upper side of the LED element, and a diffusive reflection resin layer is provided in a state that side faces of the LED element are surrounded therewith, and an area at the LED element face side of the wavelength conversion layer is at least twice larger by area ratio than an area of light emitting area on an upper surface of the LED element.

A display of an electrochromic type, including an active matrix substrate on which a plurality of pixel electrodes corresponding to pixels are arranged in a matrix form; a counter substrate which is provided with a transparent electrode that is common with respect to a plurality of the pixel electrodes; and an electrochromic material which is sandwiched between the active matrix substrate and the counter substrate, and is colored in a boundary either between itself and the pixel electrode or between itself and the transparent electrode; wherein the pixel electrode other than an electrode-exposed part which contacts with the electrochromic material is covered with a transparent protective film; and the electrode-exposed part has a different area from the area of the part onto which a current generated between the transparent electrode and the pixel electrode concentrates, out of the transparent electrode.

Provided is a method of manufacturing a structure having a transparent fine uneven structural body formed by hot water treatment, in which a finer uneven structure is formed. Provided is a method of manufacturing a structure, the method being for manufacturing a structure including a substrate, and a transparent fine uneven structural body which is formed on a surface of the substrate by hot water treatment, including: a first step of forming a precursor film of the transparent fine uneven structural body on the substrate; a second step of forming a fine uneven structure on a surface of the precursor film; and a third step of subjecting, to hot water treatment, the precursor film on which the fine uneven structure is formed to form the transparent fine uneven structural body in which a peak value ν0 of space frequency of the unevenness of the fine uneven structure formed in the second step satisfies ν<ν0 (Expression I). In Expression I, ν0 represents a peak value of space frequency of the fine uneven structure, and ν represents a peak value of space frequency of the transparent fine uneven structural body in a case in which the fine uneven structure is not formed on the surface of the precursor film.